Articles by keywords "отжиг"
The electron and proton irradiation effects on the properties of high-voltage 4H-SiC Schottky diodes within the operating temperature range
- Year: 2024
- Volume: 17
- Issue: 1
- 12
- 326
- Pages: 9-20
A facile low-temperature approach for organics removal from SiO2-CTAB mesoporous particles
- Year: 2023
- Volume: 16
- Issue: 3.2
- 0
- 596
- Pages: 183-187
Дислокационная фотолюминесценция в самоимплантированном кремнии с различными ориентациями поверхности
- Year: 2023
- Volume: 16
- Issue: 1.1
- 10
- 1284
- Pages: 162-166
Modification of the optical and electrical properties of NiO films by thermal annealing
- Year: 2022
- Volume: 15
- Issue: 3.3
- 11
- 1737
- Pages: 285-289
Development of visible-blind ultraviolet photodetectors based on ultrathin GaN epitaxial layers grown on c-Al2O3 substrates
- Year: 2022
- Volume: 15
- Issue: 3.3
- 16
- 1814
- Pages: 157-162
Study of FIB-modified silicon areas by AFM and Raman spectroscopy
- Year: 2022
- Volume: 15
- Issue: 3.3
- 16
- 1748
- Pages: 59-63
Effect of pregrowth annealing temperature on the subsequent epitaxial growth of GaAs on Si
- Year: 2022
- Volume: 15
- Issue: 3.3
- 20
- 1735
- Pages: 54-58
Effect of thermal annealing on grain size and phase changes in magnetron titanium oxide films
- Year: 2022
- Volume: 15
- Issue: 3.1
- 17
- 2066
- Pages: 149-154
The thermoelastic stresses during laser annealing of titanium dioxide on a sapphire substrate
- Year: 2022
- Volume: 15
- Issue: 3
- 26
- 2140
- Pages: 100-110
The energy spectrum and some properties of lead sulphide implanted with oxygen
- Year: 2015
- Issue: 1
- 405
- 6016
- Pages: 9-20
Characterization of radiation defects in austenitic alloys
- Year: 2014
- Issue: 2
- 306
- 5748
- Pages: 37-45
Effect of temperature on properties of DLC films and DLC-Ni:C sandwich growth
- Year: 2013
- Issue: 4
- 504
- 6375
- Pages: 115-122
Photoluminescence and Raman scattering in periodic arrays of silicon nanoinclusions in zirconia dioxide
- Year: 2010
- Issue: 1
- 0
- 5833
- Pages: 71-78
A formation method of amorphous and crystalline silicon nanoclusters in dielectric films
- Year: 2010
- Issue: 1
- 0
- 5609
- Pages: 66-71