Articles by keywords "InGaN"

Threshold current of separate spectral components of the emission spectrum of InGaN LEDs

Experimental technique and devices
  • Year: 2024
  • Volume: 17
  • Issue: 3.2
  • 0
  • 15
  • Pages: 161-165

Growth of long core-shell InGaN nanowires by plasma-assisted molecular beam epitaxy with gradually increasing substrate temperature

Physics of molecules, clusters and nanostructures
  • Year: 2024
  • Volume: 17
  • Issue: 3.2
  • 0
  • 20
  • Pages: 143-147

Influence of the wet-chemical treatment on the optical and structural properties of core-shell InGaN nanowires

Physical materials technology
  • Year: 2024
  • Volume: 17
  • Issue: 3.1
  • 6
  • 272
  • Pages: 306-309

Quantum dot-induced photoluminescence enhancement of InGaN nanowires

Physical materials technology
  • Year: 2023
  • Volume: 16
  • Issue: 3.2
  • 5
  • 1609
  • Pages: 255-260

Physical properties of GaN nanowires with core-shell InGaN/GaN insertions grown by PA-MBE on Si substrate

Physical materials technology
  • Year: 2023
  • Volume: 16
  • Issue: 1.2
  • 44
  • 2568
  • Pages: 179-184

Mechanisms leading to thermal quantum efficiency droop in green InGaN/GaN LEDs

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 1.2
  • 23
  • 2478
  • Pages: 70-76

Plasma assisted molecular beam epitaxy growth of InGaN nanostructures on Si substrates

Physical materials technology
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 26
  • 2727
  • Pages: 311-314

Physical properties of GaN/InGaN nanowires grown by PA-MBE on silicon substrate

Physical materials technology
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 29
  • 2745
  • Pages: 281-284

Optimization of InGaN-based luminescent heterostructures by genetic algorithm

Condensed matter physics
  • Year: 2022
  • Volume: 15
  • Issue: 3.2
  • 22
  • 2971
  • Pages: 21-24

Development features of degradation processes in high-power blue InGaN/GaN light-emitting diodes

Experimental technique and devices
  • Year: 2012
  • Issue: 3
  • 0
  • 6647
  • Pages: 45-48

Degradation phenomena and the problem of semiconductor light emitting sources reliability

Experimental technique and devices
  • Year: 2013
  • Issue: 2
  • 5
  • 6385
  • Pages: 71-80