Alexander V. Uvarov
Alexander V. Uvarov
Affiliation
Alferov University
Publications

Fabrication and investigation of UV photodiode based on n-GaN / p-NiO heterojunction

Physical electronics
  • Year: 2022
  • Volume: 15
  • Issue: 3.2
  • 30
  • 5139
  • Pages: 145-149

Study of recombination and transport properties of a-Si:H (i)/ μc-Si:H (n) contact system for crystalline silicon solar cells

Physical electronics
  • Year: 2022
  • Volume: 15
  • Issue: 3.2
  • 17
  • 5147
  • Pages: 150-154

Optimization of the contact grid for the GaP/Si solar cells

Simulation of physical processes
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 11
  • 5200
  • Pages: 93-96

Plasma deposited indium phosphide and its electrophysical properties

Physical electronics
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 40
  • 5767
  • Pages: 123-127

Development of visible-blind ultraviolet photodetectors based on ultrathin GaN epitaxial layers grown on c-Al2O3 substrates

Physical optics
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 35
  • 5000
  • Pages: 157-162

Study of photoconvertion heterojunction n-GaP/p-Si obtained by PE-ALD

Heterostructures, superlattices, quantum wells
  • Year: 2023
  • Volume: 16
  • Issue: 1.3
  • 17
  • 4067
  • Pages: 90-95

Formation of radial amorphous hydrogenated silicon p-i-n solar cells on silicon nanowire arrays toward flexible photovoltaics

Optoelectronic and nanoelectronic devices
  • Year: 2023
  • Volume: 16
  • Issue: 1.3
  • 11
  • 4374
  • Pages: 176-181

Flexible solar cells based on PEDOT: PSS and vertically aligned silicon structures

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 1.2
  • 49
  • 4789
  • Pages: 10-17

Heterojunction solar cells based on nanostructured black silicon

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 17
  • 4014
  • Pages: 434-438

The effect of the dielectric SiO2 layer on the characteristics of visible-blind ultraviolet photodetectors based on ultrathin GaN epitaxial layers grown on c-Al2O3 substrates

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 15
  • 3727
  • Pages: 439-443

Study of the effect of solvents and surfactants on electrical properties of PEDOT: PSS films

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 30
  • 4686
  • Pages: 468-472

Capacitance-voltage characterization of BP layers grown by PECVD mode

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 21
  • 3881
  • Pages: 473-478

Boron phosphide grown by PECVD and its optical properties

Physical materials technology
  • Year: 2023
  • Volume: 16
  • Issue: 3.2
  • 34
  • 4196
  • Pages: 273-277

Gallium phosphide/black silicon heterojunction solar cells

Physical electronics
  • Year: 2024
  • Volume: 17
  • Issue: 3.1
  • 20
  • 2467
  • Pages: 199-203

Influence of in-situ plasma treatment during PE-ALD of GaN on growth rate and morphology

Physics of molecules, clusters and nanostructures
  • Year: 2024
  • Volume: 17
  • Issue: 3.2
  • 14
  • 2117
  • Pages: 152-156

Degradation of solar heterostructured cells under the influence of electron flow

Physical optics
  • Year: 2024
  • Volume: 17
  • Issue: 3.2
  • 11
  • 2143
  • Pages: 251-255

Effect of surfactants on surface tension of PEDOT: PSS aqueous solution

Physical materials technology
  • Year: 2024
  • Volume: 17
  • Issue: 3.2
  • 15
  • 2525
  • Pages: 279-282

Admittance spectroscopy of boron phosphide heterostructures grown by plasma enhanced chemical vapor deposition on silicon substrates

Condensed matter physics
  • Year: 2024
  • Volume: 17
  • Issue: 3
  • 26
  • 3052
  • Pages: 17-24

Black silicon formation using cryogenic etching and photoresist layer

Physical electronics
  • Year: 2025
  • Volume: 18
  • Issue: 3.1
  • 0
  • 66
  • Pages: 182-186

Structural and optical properties of InP layers obtained by plasma-enhanced atomic layer deposition at different temperatures

Physical materials technology
  • Year: 2025
  • Volume: 18
  • Issue: 3.1
  • 0
  • 42
  • Pages: 247-251

Capacitance characterization of GaN/InP multilayer structures

Physical materials technology
  • Year: 2025
  • Volume: 18
  • Issue: 3.1
  • 0
  • 42
  • Pages: 258-262