Articles by keywords "atomic force microscopy"
Role of the buffer layer on the mechanical strength of nanowire-substrate interface
- Year: 2026
- Volume: 19
- Issue: 1.1
- 0
- 32
- Pages: 75-80
Heterostructures with ultrathin InxGa1−xAs/GaAs(001) metamorphic buffer layers and InAs/InGaAs QDs grown by molecular beam epitaxy
- Year: 2026
- Volume: 19
- Issue: 1.1
- 0
- 34
- Pages: 39-44
Effect of inclusion of titanium dioxide microparticles on the properties of PVDF/TiO2
- Year: 2025
- Volume: 18
- Issue: 3.2
- 2
- 636
- Pages: 242-246
Effect of functional sublayers on the characteristics of deposited diamond-like carbon coatings
- Year: 2024
- Volume: 17
- Issue: 3.2
- 10
- 2866
- Pages: 283-287
Influence of ambient humidity on the magnitude of the piezoelectric strain coefficient of nitrogen-doped carbon nanotubes for the creation of strain sensors
- Year: 2024
- Volume: 17
- Issue: 3.1
- 14
- 3069
- Pages: 210-214
Individual GaP nanowire conductivity studied with atomic force microscopy and numerical modeling
- Year: 2024
- Volume: 17
- Issue: 1.1
- 21
- 3645
- Pages: 125-130
Photo-assisted adsorption of enzyme molecules onto a surface-modified silicon substrate
- Year: 2023
- Volume: 16
- Issue: 3.1
- 7
- 4711
- Pages: 444-448
Interdigital gold electrodes for a conductometric gas sensor on the glass surface
- Year: 2023
- Volume: 16
- Issue: 3.1
- 17
- 4638
- Pages: 384-389
Nanoscale layers of hexaferrite BaFe12O19 grown by laser molecular beam epitaxy: growth, crystal structure and magnetic properties
- Year: 2023
- Volume: 16
- Issue: 1.1
- 14
- 4948
- Pages: 363-368
Cetyltrimethylammonium bromide as a soft template for the synthesis of a conductometric gas sensor active substance
- Year: 2022
- Volume: 15
- Issue: 3.3
- 10
- 5676
- Pages: 86-90
Study of FIB-modified silicon areas by AFM and Raman spectroscopy
- Year: 2022
- Volume: 15
- Issue: 3.3
- 23
- 5534
- Pages: 59-63
Features of the nanostructure formation in the Nd-Pr-Fe-B-system alloys: a study by AFM and MFM
- Year: 2022
- Volume: 15
- Issue: 2
- 58
- 7266
- Pages: 34-45
Surfaces of cohesive bonds’ fracture in the multilayer systems: A comparative analysis
- Year: 2022
- Volume: 15
- Issue: 1
- 21
- 7148
- Pages: 62-69
Low-field electron emission from thin films of metals
- Year: 2021
- Volume: 14
- Issue: 1
- 44
- 7971
- Pages: 111-127
High-magnetostriction Laves-phase alloy of the samarium-iron system: the structure and phase transformations
- Year: 2019
- Volume: 12
- Issue: 1
- 60
- 10360
- Pages: 28-38
Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy
- Year: 2015
- Issue: 1
- 601
- 9867
- Pages: 31-42
Surface morphology and field emission of the magnetron deposited carbon films
- Year: 2013
- Issue: 3
- 695
- 10522
- Pages: 144-150
Transistor pHEMT structures: Studies on semiconductor heterostructure peculiarities using atomic force microscopy methods
- Year: 2010
- Issue: 1
- 1
- 9266
- Pages: 18-28
The investigation of PVC-based nanocomposites by atomic force microscopy
- Year: 2013
- Issue: 1
- 856
- 11106
- Pages: 114-119

