Articles by keywords "atomic force microscopy"

Photo-assisted adsorption of enzyme molecules onto a surface-modified silicon substrate

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 2
  • 463
  • Pages: 444-448

Interdigital gold electrodes for a conductometric gas sensor on the glass surface

Experimental technique and devices
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 4
  • 483
  • Pages: 384-389

Nanoscale layers of hexaferrite BaFe12O19 grown by laser molecular beam epitaxy: growth, crystal structure and magnetic properties

Atom physics and physics of clusters and nanostructures
  • Year: 2023
  • Volume: 16
  • Issue: 1.1
  • 5
  • 1024
  • Pages: 363-368

Cetyltrimethylammonium bromide as a soft template for the synthesis of a conductometric gas sensor active substance

Simulation of physical processes
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 6
  • 1478
  • Pages: 86-90

Study of FIB-modified silicon areas by AFM and Raman spectroscopy

Condensed matter physics
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 16
  • 1579
  • Pages: 59-63

Effect of thickness and annealing of the Si(001)2×1-Cu wetting layer on the morphology of layered nanofilms based on Fe, Co, and Cu and their ferromagnetic properties

Atom physics and physics of clusters and nanostructures
  • Year: 2022
  • Volume: 15
  • Issue: 3.1
  • 18
  • 1969
  • Pages: 131-136

Features of the nanostructure formation in the Nd-Pr-Fe-B-system alloys: a study by AFM and MFM

Physical materials technology
  • Year: 2022
  • Volume: 15
  • Issue: 2
  • 49
  • 2633
  • Pages: 34-45

Surfaces of cohesive bonds’ fracture in the multilayer systems: A comparative analysis

Physical materials technology
  • Year: 2022
  • Volume: 15
  • Issue: 1
  • 15
  • 2824
  • Pages: 62-69

Low-field electron emission from thin films of metals

Physical electronics
  • Year: 2021
  • Volume: 14
  • Issue: 1
  • 41
  • 3652
  • Pages: 111-127

High-magnetostriction Laves-phase alloy of the samarium-iron system: the structure and phase transformations

Condensed matter physics
  • Year: 2019
  • Volume: 12
  • Issue: 1
  • 55
  • 5945
  • Pages: 28-38

Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy

Condensed matter physics
  • Year: 2015
  • Issue: 1
  • 600
  • 6044
  • Pages: 31-42

Surface morphology and field emission of the magnetron deposited carbon films

Physical electronics
  • Year: 2013
  • Issue: 3
  • 695
  • 6731
  • Pages: 144-150

Transistor pHEMT structures: Studies on semiconductor heterostructure peculiarities using atomic force microscopy methods

Condensed matter physics
  • Year: 2010
  • Issue: 1
  • 1
  • 5462
  • Pages: 18-28

The investigation of PVC-based nanocomposites by atomic force microscopy

Physical materials technology
  • Year: 2013
  • Issue: 1
  • 853
  • 7233
  • Pages: 114-119