Articles by keywords "atomic force microscopy"
Influence of ambient humidity on the magnitude of the piezoelectric strain coefficient of nitrogen-doped carbon nanotubes for the creation of strain sensors
- Year: 2024
- Volume: 17
- Issue: 3.1
- 0
- 25
- Pages: 210-214
Individual GaP nanowire conductivity studied with atomic force microscopy and numerical modeling
- Year: 2024
- Volume: 17
- Issue: 1.1
- 10
- 945
- Pages: 125-130
Photo-assisted adsorption of enzyme molecules onto a surface-modified silicon substrate
- Year: 2023
- Volume: 16
- Issue: 3.1
- 4
- 1582
- Pages: 444-448
Interdigital gold electrodes for a conductometric gas sensor on the glass surface
- Year: 2023
- Volume: 16
- Issue: 3.1
- 6
- 1670
- Pages: 384-389
Nanoscale layers of hexaferrite BaFe12O19 grown by laser molecular beam epitaxy: growth, crystal structure and magnetic properties
- Year: 2023
- Volume: 16
- Issue: 1.1
- 7
- 1949
- Pages: 363-368
Cetyltrimethylammonium bromide as a soft template for the synthesis of a conductometric gas sensor active substance
- Year: 2022
- Volume: 15
- Issue: 3.3
- 8
- 2534
- Pages: 86-90
Study of FIB-modified silicon areas by AFM and Raman spectroscopy
- Year: 2022
- Volume: 15
- Issue: 3.3
- 16
- 2614
- Pages: 59-63
Effect of thickness and annealing of the Si(001)2×1-Cu wetting layer on the morphology of layered nanofilms based on Fe, Co, and Cu and their ferromagnetic properties
- Year: 2022
- Volume: 15
- Issue: 3.1
- 20
- 2997
- Pages: 131-136
Features of the nanostructure formation in the Nd-Pr-Fe-B-system alloys: a study by AFM and MFM
- Year: 2022
- Volume: 15
- Issue: 2
- 52
- 3842
- Pages: 34-45
Surfaces of cohesive bonds’ fracture in the multilayer systems: A comparative analysis
- Year: 2022
- Volume: 15
- Issue: 1
- 16
- 3963
- Pages: 62-69
Low-field electron emission from thin films of metals
- Year: 2021
- Volume: 14
- Issue: 1
- 42
- 4815
- Pages: 111-127
High-magnetostriction Laves-phase alloy of the samarium-iron system: the structure and phase transformations
- Year: 2019
- Volume: 12
- Issue: 1
- 58
- 7079
- Pages: 28-38
Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy
- Year: 2015
- Issue: 1
- 600
- 6981
- Pages: 31-42
Surface morphology and field emission of the magnetron deposited carbon films
- Year: 2013
- Issue: 3
- 695
- 7774
- Pages: 144-150
Transistor pHEMT structures: Studies on semiconductor heterostructure peculiarities using atomic force microscopy methods
- Year: 2010
- Issue: 1
- 1
- 6545
- Pages: 18-28
The investigation of PVC-based nanocomposites by atomic force microscopy
- Year: 2013
- Issue: 1
- 853
- 8224
- Pages: 114-119