Articles by keywords "atomic force microscopy"

Influence of ambient humidity on the magnitude of the piezoelectric strain coefficient of nitrogen-doped carbon nanotubes for the creation of strain sensors

Physical electronics
  • Year: 2024
  • Volume: 17
  • Issue: 3.1
  • 0
  • 25
  • Pages: 210-214

Individual GaP nanowire conductivity studied with atomic force microscopy and numerical modeling

Quantum wires, quantum dots, and other low-dimensional systems
  • Year: 2024
  • Volume: 17
  • Issue: 1.1
  • 10
  • 945
  • Pages: 125-130

Photo-assisted adsorption of enzyme molecules onto a surface-modified silicon substrate

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 4
  • 1582
  • Pages: 444-448

Interdigital gold electrodes for a conductometric gas sensor on the glass surface

Experimental technique and devices
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 6
  • 1670
  • Pages: 384-389

Nanoscale layers of hexaferrite BaFe12O19 grown by laser molecular beam epitaxy: growth, crystal structure and magnetic properties

Atom physics and physics of clusters and nanostructures
  • Year: 2023
  • Volume: 16
  • Issue: 1.1
  • 7
  • 1949
  • Pages: 363-368

Cetyltrimethylammonium bromide as a soft template for the synthesis of a conductometric gas sensor active substance

Simulation of physical processes
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 8
  • 2534
  • Pages: 86-90

Study of FIB-modified silicon areas by AFM and Raman spectroscopy

Condensed matter physics
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 16
  • 2614
  • Pages: 59-63

Effect of thickness and annealing of the Si(001)2×1-Cu wetting layer on the morphology of layered nanofilms based on Fe, Co, and Cu and their ferromagnetic properties

Atom physics and physics of clusters and nanostructures
  • Year: 2022
  • Volume: 15
  • Issue: 3.1
  • 20
  • 2997
  • Pages: 131-136

Features of the nanostructure formation in the Nd-Pr-Fe-B-system alloys: a study by AFM and MFM

Physical materials technology
  • Year: 2022
  • Volume: 15
  • Issue: 2
  • 52
  • 3842
  • Pages: 34-45

Surfaces of cohesive bonds’ fracture in the multilayer systems: A comparative analysis

Physical materials technology
  • Year: 2022
  • Volume: 15
  • Issue: 1
  • 16
  • 3963
  • Pages: 62-69

Low-field electron emission from thin films of metals

Physical electronics
  • Year: 2021
  • Volume: 14
  • Issue: 1
  • 42
  • 4815
  • Pages: 111-127

High-magnetostriction Laves-phase alloy of the samarium-iron system: the structure and phase transformations

Condensed matter physics
  • Year: 2019
  • Volume: 12
  • Issue: 1
  • 58
  • 7079
  • Pages: 28-38

Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy

Condensed matter physics
  • Year: 2015
  • Issue: 1
  • 600
  • 6981
  • Pages: 31-42

Surface morphology and field emission of the magnetron deposited carbon films

Physical electronics
  • Year: 2013
  • Issue: 3
  • 695
  • 7774
  • Pages: 144-150

Transistor pHEMT structures: Studies on semiconductor heterostructure peculiarities using atomic force microscopy methods

Condensed matter physics
  • Year: 2010
  • Issue: 1
  • 1
  • 6545
  • Pages: 18-28

The investigation of PVC-based nanocomposites by atomic force microscopy

Physical materials technology
  • Year: 2013
  • Issue: 1
  • 853
  • 8224
  • Pages: 114-119