Articles by keywords "interface"
Effect of different types of phonons on the two-dimensional electron gas heating at GaN/AlGaN heterointerface
- Year: 2025
- Volume: 18
- Issue: 1.1
- 0
- 3
- Pages: 58-66
Magnetic field effect on interface states in ZnSe/BeTe quantum well structures with no common atom
- Year: 2025
- Volume: 18
- Issue: 1.1
- 0
- 3
- Pages: 52-57
Admittance spectroscopy of boron phosphide heterostructures grown by plasma enhanced chemical vapor deposition on silicon substrates
- Year: 2024
- Volume: 17
- Issue: 3
- 21
- 1190
- Pages: 17-24
Analytical study of operating modes of RF ion funnels in the gas dynamic interfaces of tandem triple-quadrupole mass-spectrometers
- Year: 2023
- Volume: 16
- Issue: 4
- 19
- 2285
- Pages: 134-145
An antiplane crack emerging from the top of a composite functional gradient wedge
- Year: 2023
- Volume: 16
- Issue: 3
- 163
- 2615
- Pages: 150-159
Giant lateral photovoltaic effect in the TiO2/SiO2/p-Si heterostructure
- Year: 2022
- Volume: 15
- Issue: 3.1
- 22
- 4119
- Pages: 32-37
Functionally graded wedge weakened by a semi-infinite crack
- Year: 2022
- Volume: 15
- Issue: 3
- 20
- 3636
- Pages: 201-213
Structure characteristics of nanoporous glass with the carbon-modified interface
- Year: 2021
- Volume: 14
- Issue: 4
- 70
- 5340
- Pages: 114-125
Deflection of an interface crack from the straight-line growth due to the unstraightness of the material interface
- Year: 2021
- Volume: 14
- Issue: 2
- 97
- 5501
- Pages: 130-140
A triangulation sensor for measuring the displacements and high-precision monitoring of the production performance
- Year: 2020
- Volume: 13
- Issue: 1
- 38
- 7285
- Pages: 54-65
A study of thermal regime in the high-power LED arrays
- Year: 2018
- Volume: 11
- Issue: 3
- 32
- 8036
- Pages: 39-51
Mode III crack approaching to the wedge-shaped elastic inclusion
- Year: 2017
- Volume: 10
- Issue: 2
- 38
- 7188
- Pages: 99-109
The study of Cu/Nb interface diffusion using molecular dynamics simulation
- Year: 2016
- Issue: 2
- 147
- 7519
- Pages: 37-43
Transistor pHEMT structures: Studies on semiconductor heterostructure peculiarities using atomic force microscopy methods
- Year: 2010
- Issue: 1
- 1
- 7219
- Pages: 18-28