Articles by keywords "focused ion beam"
Fabrication of nanoscale structures by FIB-induced deposition of materials and study of their electrical properties
- Year: 2023
- Volume: 16
- Issue: 1.2
- 1
- 420
- Pages: 218-223
Study of FIB-modified silicon areas by AFM and Raman spectroscopy
- Year: 2022
- Volume: 15
- Issue: 3.3
- 12
- 962
- Pages: 59-63
Effect of pregrowth annealing temperature on the subsequent epitaxial growth of GaAs on Si
- Year: 2022
- Volume: 15
- Issue: 3.3
- 14
- 984
- Pages: 54-58
Experimental study of nanoholes formation using local droplet etching of FIB-modified GaAs (001) surface
- Year: 2022
- Volume: 15
- Issue: 3.3
- 11
- 940
- Pages: 48-53
Effect of FIB-modification of Si(111) surface on GaAs nanowire growth
- Year: 2022
- Volume: 15
- Issue: 3.3
- 10
- 939
- Pages: 36-41