Komkov Oleg V
  • Affiliation
    St. Petersburg Electrotechnical University "LETI"
  • St. Petersburg, Russian Federation

Temperature dependence of the energy spectrum of metamorphic InSb/In(Ga,Al)As/GaAs heterostructures studied using FTIR photoreflectance spectroscopy

Condensed matter physics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 26
  • 2445
  • Pages: 47-52

Optical anisotropy of black phosphorus characterized by FTIR spectroscopy methods

Physical materials technology
  • Year: 2023
  • Volume: 16
  • Issue: 3.2
  • 21
  • 2487
  • Pages: 228-232

Study of the band structure of GeSiSn/Ge/Si heterostructures by FTIR photoreflectance spectroscopy

Heterostructures, superlattices, quantum wells
  • Year: 2024
  • Volume: 17
  • Issue: 1.1
  • 33
  • 1822
  • Pages: 62-67

Polarized reflectance spectroscopy of aluminum nanoantennas on the surface of emitting GeSiSn/Si heterostructures

Heterostructures, superlattices, quantum wells
  • Year: 2024
  • Volume: 17
  • Issue: 1.1
  • 32
  • 1969
  • Pages: 83-88

Optical characteristics of Hg0.7Cd0.3Te films with etched graded-gap surface layer

Structure growth, surface, and interfaces
  • Year: 2025
  • Volume: 18
  • Issue: 1.1
  • 7
  • 297
  • Pages: 34-39

Influence of disordering in InAsSbP barrier layers on the characteristics of InAsSb-based LEDs

Optoelectronic and nanoelectronic devices
  • Year: 2025
  • Volume: 18
  • Issue: 1.1
  • 6
  • 283
  • Pages: 105-110

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