Articles by keywords "transistor"

Radiation hardness of n–p–n type bipolar transistor for voltage regulators

Physical electronics
  • Year: 2025
  • Volume: 18
  • Issue: 3.2
  • 3
  • 207
  • Pages: 149-154

Thin reduced graphene oxide based films for nanoelectronics and sensors

Condensed matter physics
  • Year: 2025
  • Volume: 18
  • Issue: 3.1
  • 2
  • 269
  • Pages: 23-29

Field plates design optimization to increase breakdown voltage of GaN HEMT

Physical electronics
  • Year: 2024
  • Volume: 17
  • Issue: 3.1
  • 20
  • 2825
  • Pages: 204-209

A microwave method for measuring the low-frequency noise of transistors

Experimental technique and devices
  • Year: 2024
  • Volume: 17
  • Issue: 2
  • 21
  • 3894
  • Pages: 61-70

Simulation and analysis of heterostructures for normally-off p-channel GaN transistor

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 30
  • 4106
  • Pages: 449-453

Long-term stability of GaAs-based pseudomorphic transistor heterostructures with InGaAs channel

Condensed matter physics
  • Year: 2023
  • Volume: 16
  • Issue: 3.1
  • 10
  • 4035
  • Pages: 133-137

In situ conductance studies of electrochemically doped polymer thin films based on nickel-salen complexes

Physical electronics
  • Year: 2023
  • Volume: 16
  • Issue: 1.2
  • 22
  • 4850
  • Pages: 90-95

GaN IC E-mode p-channel and n-channel transistors simulation

Physical electronics
  • Year: 2022
  • Volume: 15
  • Issue: 3.3
  • 25
  • 5106
  • Pages: 134-137

Optimization of heterostructure transistor parameters for the monolithic integrated circuits of the amplifying path of a medical radiothermograph

Physics of molecules
  • Year: 2022
  • Volume: 15
  • Issue: 3.2
  • 9
  • 4940
  • Pages: 326-330

Algorithm and installation for measuring the current lacing voltage in high-power RF and microwave bipolar and heterojunction bipolar transistors

Experimental technique and devices
  • Year: 2022
  • Volume: 15
  • Issue: 3.2
  • 9
  • 5352
  • Pages: 97-101

Transistor pHEMT structures: Studies on semiconductor heterostructure peculiarities using atomic force microscopy methods

Condensed matter physics
  • Year: 2010
  • Issue: 1
  • 1
  • 8884
  • Pages: 18-28