Articles by keywords "admittance spectroscopy"
Capacitance characterization of GaN/InP multilayer structures
- Year: 2025
- Volume: 18
- Issue: 3.1
- 0
- 24
- Pages: 258-262
Admittance spectroscopy of boron phosphide heterostructures grown by plasma enhanced chemical vapor deposition on silicon substrates
- Year: 2024
- Volume: 17
- Issue: 3
- 26
- 3034
- Pages: 17-24
Study of photoconvertion heterojunction n-GaP/p-Si obtained by PE-ALD
- Year: 2023
- Volume: 16
- Issue: 1.3
- 17
- 4052
- Pages: 90-95