Spivak Yulia M.
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- 2024, Volume 17 Issue 3
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Transistor pHEMT structures: Studies on semiconductor heterostructure peculiarities using atomic force microscopy methods
- Year: 2010
- Issue: 1
- 1
- 6462
- Pages: 18-28
Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy
- Year: 2015
- Issue: 1
- 600
- 6909
- Pages: 31-42
Compositions based on porous silicon and nickel oxide obtained by cooperative synthesis
- Year: 2023
- Volume: 16
- Issue: 1.1
- 15
- 2285
- Pages: 393-397