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Kirill A. Lozovoy
Affiliation
National Research Tomsk State University
Tomsk, Russian Federation
Publications
Orcid ID
0000-0002-4029-8353
Effect of temperature during homoepitaxial growth of Si on Si (100) on the character of reflection high-energy electron diffraction patterns
- Year: 2023
- Volume: 16
- Issue: 3.1
- 19
- 3651
- Pages: 112-116
Modeling the characteristics of avalanche photodiodes based on Ge/Si
- Year: 2023
- Volume: 16
- Issue: 3.1
- 29
- 4066
- Pages: 232-236
Study of the formation mechanisms of Ge terraces on Si (100) during MBE using the RHEED method
- Year: 2024
- Volume: 17
- Issue: 3.2
- 8
- 1979
- Pages: 139-142