Using atomic-force microscopy techniques for an analysis of ferroelectric and magnetic properties of bismuth-doped terbium manganite at low temperatures

St. Petersburg Polytechnic University Journal: Physics and Mathematics Peter the Great St. Petersburg Polytechnic University

Since 2008

ISSN 2304-9782

ISSN 2618-8686

ISSN 2405-7223

Year: 2013 Issue: 2 (170)

128 177740

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UDK: 538.975: 620.22 - 022.53

Article type: Research Article

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Using atomic-force microscopy techniques for an analysis of ferroelectric and magnetic properties of bismuth-doped terbium manganite at low temperatures

Physical materials technology

Authors:

Andreeva Nataliya V. Sanina Victoria A. Filimonov Alexey V. Fotiadi Alexander E.

Abstract:

Magnetic and ferroelectric properties of the doped single crystal Tb0.95Bi0.05MnO3 have been investigated using magnetic force microscopy and piezoresponse force microscopy in the temperature range of 4 – 30 K. Local magnetic and ferroelectric ordering in the Tb0.95Bi0.05MnO3 crystal was observed at low temperatures. An absence of correlation in distribution of ferromagnetic clusters and polar nanodomain areas was found in the temperature range of 4 – 30 K.