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A fast-operating interferometry device for measuring films thickness over the range from ten to one thousand microns
- Year: 2012
- Issue: 3
- 0
- 8874
- Pages: 48-55
A transient process while pulsed electro- magnetic field scattering on the spheroidal magnetic shell
- Year: 2010
- Issue: 4
- 0
- 8281
- Pages: 86-89