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The Casimir force pressure onthe dielectric layer in nanoscale solid-state multilayer Al — SiO2 — Si structures
- Year: 2012
- Issue: 3
- 0
- 8383
- Pages: 22-28
A fast-operating interferometry device for measuring films thickness over the range from ten to one thousand microns
- Year: 2012
- Issue: 3
- 0
- 8874
- Pages: 48-55