A software-hardware complex for the study of electrophysical parameters of active dielectrics

Experimental technique and devices
Authors:
Emelyanov Nikita S. Zhurina Angelina E. Pecherskaya Ekaterina A. Shepeleva Juliya V. Maksov Andrey A.
Abstract:

Since the electrophysical parameters of ferroelectrics and the possibility of their application in functional electronics elements depend significantly on temperature, the work is aimed at solving the actual problem of creating a software-hardware complex that makes it possible to measure the temperature dependences of the capacitance and relative permittivity, taking into account the specifics of the physical effects inherent in these materials. Measurement procedures automation, which makes it possible to reduce the time for performing measurements and processing experimental data, eliminating subjective error and reducing a number of methodological errors is provided, since the electrophysical parameters measurements of ferroelectrics are possible only by indirect methods that require calculations according to the accepted models of the measurement object. As part of the software-hardware complex, it is proposed to use a computer-controlled heat chamber to study the temperature effect in a wide temperature range, which should cover the phase transitions of the studied materials and structures based on them. The principles and methods for measuring various functional dependencies are shown. For example, when studying the frequency characteristics of ferroelectrics, the test signal frequency is changed, the temperature characteristics are changed by the heat chamber temperature, and when studying capacitance-voltage characteristics, the bias voltage on the sample is changed. The article describes the operation of the software-hardware complex and the device of the thermal chamber. The result of the work was a multifunctional measuring device that allows to increase the technical and economic efficiency of the ferroelectrics study, by reducing the measurement time and reducing the measurement errors of material parameters (electric field strengths, sample polarizations and electrical impedance), depending on the influencing factors (range up to 100 °C).