Measurement of the threshold current in the local areas of the LED chip

Experimental technique and devices
Authors:
Frolov Ilya V. Radaev Oleg A. Sergeev Viacheslav A.
Abstract:

A method for measuring the threshold current in local areas of an LED chip is presented, which consists in recording chip images at three low currents and pixel-by-pixel calculation of threshold current values by solving a system of equations compiled for three values of the approximating function. Approbation was carried out on commercial green and blue LEDs. It is shown that the distribution of threshold current values over the chip is uneven.