Reliability of 808 nm QCW laser diode arrays

The dependence of radiative characteristics of 808 nm QCW laser diode arrays (LDAs) on power supply modes and thermostabilization temperature was studied. The accelerated lifetime test method is suggested at 6% duty cycle exceeding the nominal value by a factor of 2.5 and at two emitter junction temperatures of 65.0ºC and 82.5ºC. Accumulated total LDA operation time in the accelerated mode was more than 7.0·10⁸ pulses that allows predicting
LDA operation time to be nearly 3.5·10¹⁰ pulses in nominal power supply modes (i.e. more than 60 thousand hours or 7.0 years of continuous work at 100 Hz frequency).