Articles by keywords "total external reflection method"
Porosity and surface morphology of lead selenide – tin selenide layers on silicon substrates: X-ray diffraction studies
- Year: 2018
- Volume: 11
- Issue: 1
- 31
- 7458
- Pages: 102-111
SPbPU Journal - Physics and Mathematics
St. Petersburg Polytechnic University Journal: Physics and Mathematics
Peter the Great St. Petersburg Polytechnic University
Since 2008
ISSN 2304-9782
ISSN 2618-8686
ISSN 2405-7223