Relationship between the luminous flux drop of LED matrices during tests with thermal resistance and parameters of the emission spectrum

Accelerated tests of LED matrices under the action of electric current under conditions of thermal cycling and vibration were carried out. It was determined that the value of the luminous flux decay correlates with the junction-to-case thermal resistance of the matrices and the value of the K_S coefficient, which determines the ratio of the luminous flux of optical emission in the near infrared region of the spectrum from 760 nm to 900 nm to the luminous flux in the spectrum range from 470 nm to 760 nm. The correlation coefficient between the luminous flux decay and the junction-to-case thermal resistance is 0.7, and the correlation coefficient between the luminous flux decay and the K_S coefficient is 0.48.