Articles by keywords "film thickness"
A fast-operating interferometry device for measuring films thickness over the range from ten to one thousand microns
- Year: 2012
- Issue: 3
- 0
- 7683
- Pages: 48-55
SPbPU Journal - Physics and Mathematics
St. Petersburg Polytechnic University Journal: Physics and Mathematics
Peter the Great St. Petersburg Polytechnic University
Since 2008
ISSN 2304-9782
ISSN 2618-8686
ISSN 2405-7223