Articles by keywords "dielectric continuum model"
The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices
- Year: 2016
- Issue: 2
- 184
- 7066
- Pages: 27-36
SPbPU Journal - Physics and Mathematics
St. Petersburg Polytechnic University Journal: Physics and Mathematics
Peter the Great St. Petersburg Polytechnic University
Since 2008
ISSN 2304-9782
ISSN 2618-8686
ISSN 2405-7223