Articles by keywords "GaN/AlGaN heterostructure"
A microwave method for measuring the low-frequency noise of transistors
- Year: 2024
- Volume: 17
- Issue: 2
- 12
- 977
- Pages: 61-70
The growth of gallium nitride layers with low dislocation density
- Year: 2012
- Issue: 4
- 0
- 6302
- Pages: 28-31