<?xml version="1.0" encoding="utf-8"?>
<journal>
  <titleid/>
  <issn>2304-9782, 2618-8686, 2405-7223</issn>
  <journalInfo lang="ENG">
    <title>St. Petersburg Polytechnic University Journal: Physics and Mathematics</title>
  </journalInfo>
  <issue>
    <volume>17</volume>
    <number>2</number>
    <altNumber> </altNumber>
    <dateUni>2024</dateUni>
    <pages>1-176</pages>
    <articles>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>8-20</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0003-1442-4886</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Babich </surname>
              <initials>Elena</initials>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-6308-733X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Kolesnik</surname>
              <initials>Elizaveta</initials>
              <email>kolesnik_ev@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">The testing of some extra accuracy schemes on the problem of the shock wave – vortex interaction</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In the paper, the calculation results of the shock wave – isoentropic vortex interaction have been presented. A complex nonstationary shock wave pattern was analyzed. The influence of the scheme for approximating the convective flows on the solution accuracy was shown to be weak. The results of calculations conducted using some extra accuracy schemes are presented: the data obtained by the second-order TVD scheme and the fifth-order WENO one being compared. The most accurate reconstruction of the vortex structure after its interaction with the shock wave was found to be achieved in the calculations when taking the WENO scheme.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17201</doi>
          <udk>519.6:533.6.011</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>shock wave interaction</keyword>
            <keyword>isoentropic vortex</keyword>
            <keyword>numerical simulation</keyword>
            <keyword>finite volume method</keyword>
            <keyword>extra accuracy scheme</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.1/</furl>
          <file>01_8-20_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>21-32</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>“B. E. Vedeneev VNIIG”, JSC</orgName>
              <surname>Andrianova </surname>
              <initials>Elena </initials>
              <email>elena-andrianova@bk.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">An algorithm for finding the damping coefficients based on vibration surveys using the frequency domain decomposition (FDD) method</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The article presents an algorithm and a theoretical justification for the method of finding the damping coefficients on the base of vibration surveys using the frequency domain decomposition (FDD) method. This method is used for monitoring the structures such as buildings, bridges, dams, to determine experimentally their state (under operating conditions) without application of vibroexciters.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17202</doi>
          <udk>51-74</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>frequency domain decomposition</keyword>
            <keyword>damping coefficient</keyword>
            <keyword>spectral density matrix</keyword>
            <keyword>natural mode shape and frequency</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.2/</furl>
          <file>02_21-32_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>33-38</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Matvienko </surname>
              <initials>Aleksandra N.</initials>
              <email>matvienko_an@spbstu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">The ways to form fullerens structure exemplified by С28 and С30 isomers</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The systematization of possible ways to form C28 and C30 fullerene isomers has been completed in this work. An additional confirmation was obtained that fullerenes created by incorporating dimers into the initial structure had a minimum energy. Two other methods for the formation of new fullerenes were also considered, namely, the connection of two domes with the same symmetry and that of fullerenes with compatible symmetry. The symmetry order of the studied fullerenes varied from the second to the seventh ones. A collaboration analysis of the formation energy values and geometric simulation results allowed us to draw conclusions about the structural changes in the resulting fullerenes.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17203</doi>
          <udk>54.022</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>dimer</keyword>
            <keyword>isomer</keyword>
            <keyword>symmetry</keyword>
            <keyword>fulleren</keyword>
            <keyword>energy</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.3/</furl>
          <file>03_33-38_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>39-60</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0003-0985-5964</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute for Analytical Instrumentation of the RAS</orgName>
              <surname>Berdnikov</surname>
              <initials>Alexander</initials>
              <email>asberd@yandex.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-9235-8549</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute for Analytical Instrumentation, RAS</orgName>
              <surname>Bulyanitsa</surname>
              <initials>Anton</initials>
              <email>antbulyan@yandex.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0003-3514-8577</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Solovyev</surname>
              <initials>Konstantin</initials>
              <email>k-solovyev@mail.ru</email>
              <address>Russia, 195251, St.Petersburg, Polytechnicheskaya, 29</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">On associated homogeneous Gelfand functions</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The paper proposes refined definitions for associated homogeneous functions (AHFs) of real variables, which are of great practical importance for a wide range of problems. I. M. Gelfand and Z. Ya. Shapiro were the first in 1955 to introduce AHFs into scientific use. However, the possibilities of using these functions in various applications have not been exhausted to this day. The proposed definitions inherit the basic idea of the original paper to define chains of new functions using the recurrent linear functional relations, where some homogeneous Euler function is the starting point. This makes it possible to apply the corresponding results not only for differentiable and continuous functions, but also for discontinuous functions, including discontinuous ones at all points. The possibility of constructing a detailed consistent theory of AHFs of real variables, defined by a chain of linear recurrent functional relations of a general form, is shown. The basic theorems are formulated and proven. Further ways of generalizing the functions under consideration are discussed.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17204</doi>
          <udk>517.982.42</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>associated homogeneous Gelfand functions</keyword>
            <keyword>homogeneous Euler function</keyword>
            <keyword>recurrent linear functional relations</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.4/</furl>
          <file>04_39-60_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>61-70</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Usychenko </surname>
              <initials>Victor </initials>
              <email>usychenko@rphf.spbstu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0003-1519-0460</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Chernova </surname>
              <initials>Anastasiya</initials>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">A microwave method for measuring the low-frequency noise of transistors</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In the article, we have proposed to use microwave-fluctuation meters resistant to external intense electromagnetic noise in order to measure the low-frequency (LF) noise of microwave transistors working under these conditions. The transistor located on the board is excited by a low-noise microwave generator, the oscillation amplitude of which, being modulated by the LF noise of the transistor, is measured by a microwave spectrum analyzer. The proposed method was tested on GaN/AlGaN heterotransistors, in whose channels the electron density was formed by spontaneous and piezoelectric polarization. In addition to experimental testing, a theoretical justification for the method is presented. We obtained conditions in which the normalized spectra of oscillation amplitude fluctuations were similar to the normalized LF noise of the transistor current.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17205</doi>
          <udk>621.391.822, 621.391.823</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>low frequency noise</keyword>
            <keyword>microwave transistor</keyword>
            <keyword>fluctuations of microwave oscillations</keyword>
            <keyword>GaN/AlGaN heterostructure</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.5/</furl>
          <file>05_61-70_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>71-79</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Al-Wataniya Private University</orgName>
              <surname>Nassif</surname>
              <initials>Alaa</initials>
              <email>alaa.nassif@wpu.edu.sy</email>
              <address>Al-Wataniya Private University, International Hama‒Homs‎ Highway, Hama, XQ92+PMC, Syria</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>University Homs</orgName>
              <surname>Sahyouni</surname>
              <initials>Walid</initials>
              <email>wsahyouni@homs-univ.edu.sy</email>
              <address>Homs University, Homs, PP75+5VC, Syria</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>University Homs</orgName>
              <surname>Zeidan</surname>
              <initials>Ola</initials>
              <email>ozedan@homs-univ.edu.sy</email>
              <address>Homs, PP75+5VC, Syria</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Discussion of plasma focus parameters and gain/loss energy ‎processes for a designed plasma focus device</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this research, a design for a dense plasma focus device has been developed, the plasma-focus parameters and the processes of gain/loss energy have been studied using the Lee code. The outcome was compared with that for UNU ICTP/PFF dense plasma focus device. The obtained results gave a good agreement between the data on the two devices, they also showed an increase in the linear emission process and thus an increase in the X-ray yield of the designed device compared to UNU ICTP/PFF one.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17206</doi>
          <udk>533.9.07</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>dense plasma focus,‎‏ Lee code,‎‎ line emission</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.6/</furl>
          <file>06_71-79_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>80-93</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Bizyaev </surname>
              <initials>Ivan </initials>
              <email>ivanbiziaev@yandex.com</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <researcherid>P-6861-2015</researcherid>
              <scopusid>10041592700</scopusid>
              <orcid>https://orcid.org/0000-0003-2511-0188</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Karaseov</surname>
              <initials>Platon</initials>
              <email>platon.karaseov@spbstu.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0003-1770-1877</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Karabeshkin</surname>
              <initials>Konstantin</initials>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0002-2519-2577</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Gabdullin</surname>
              <initials>Pavel</initials>
              <email>gabdullin_pg@spbstu.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0002-3321-7797</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Arkhipov</surname>
              <initials>Alexander</initials>
              <email>arkhipov@rphf.spbstu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Transformation of the structure of thin metal films upon activation of their ability to low-voltage electron emission</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">This work continues the studies of low-threshold field electron emission from thin (6 – 10 nm) films of refractory metals (Mo or Zr) deposited on flat Si substrates. Now, we have investigated the changes in the films’ morphology induced by thermo- and electroforming procedures and by the extraction of emission current. In SEM images of the samples taken after emission experiments, we observed the signs of solid-state dewetting (agglomeration) of the films, presumably caused by ion bombardment. This hypothesis was verified by SRIM simulations of the effect of ions on Mo-film/Si-substrate structure, as well as by an experiment at a HVEE-500 ion implanter.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17207</doi>
          <udk>537.533.2, 538.975, 539.1.06</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>thin films</keyword>
            <keyword>low-field electron emission</keyword>
            <keyword>film dewetting</keyword>
            <keyword>ion bombardment</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.7/</furl>
          <file>07_80-93_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>94-119</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0003-0985-5964</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute for Analytical Instrumentation of the RAS</orgName>
              <surname>Berdnikov</surname>
              <initials>Alexander</initials>
              <email>asberd@yandex.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-0873-8849</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute for Analytical Instrumentation of the Russian Academy of Sciences</orgName>
              <surname>Masyukevich</surname>
              <initials>Sergey</initials>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Institute for Analytical Instrumentation of the RAS</orgName>
              <surname>Pomozov</surname>
              <initials>Timofey</initials>
              <email>tim-kor@mail.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0009-0002-1506-0631</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute for Analytical Instrumentation, RAS</orgName>
              <surname>Hasin</surname>
              <initials>Yuri </initials>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0003-3514-8577</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Solovyev</surname>
              <initials>Konstantin</initials>
              <email>k-solovyev@mail.ru</email>
              <address>Russia, 195251, St.Petersburg, Polytechnicheskaya, 29</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Analytical electric potentials for simulation of the multipole radiofrequency ion funnels with nonlinear profiles</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The article considers analytical expressions for electric field potentials that correspond to radio frequency funnels with quadratic, cubic and biquadratic profiles. The funnel electrodes are a sequence of diaphragms with a circular or multipole structure and apertures of variable size. The latter varies along the transport channel according to the desired law. The resulting expressions can be useful for fast, high-quality simulation of radiofrequency devices designed to convey ion beams with simultaneous focusing.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17208</doi>
          <udk>537.21, 517.958</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>Laplace equation</keyword>
            <keyword>periodic electrodes</keyword>
            <keyword>analytical electric field</keyword>
            <keyword>ion guide</keyword>
            <keyword>ion funnel</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.8/</furl>
          <file>08_94-119_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>120-133</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0001-5547-9387</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Fedorov</surname>
              <initials>Vladimir</initials>
              <email>fedorov_vv@spbstu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-7521-3754</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University, RAS</orgName>
              <surname>Fedina</surname>
              <initials>Sergey</initials>
              <email>fedina.serg@yandex.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-3640-677X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Ioffe Institute</orgName>
              <surname>Kaveev</surname>
              <initials>Andrey</initials>
              <email>kaveev@mail.ioffe.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0002-1571-209X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Kirilenko</surname>
              <initials>Demid</initials>
              <email>demid.kirilenko@mail.ioffe.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Ioffe Institute, RAS</orgName>
              <surname>Faleev </surname>
              <initials>Nikolai </initials>
              <email>nfaleev@mail.ioffe.ru</email>
            </individInfo>
          </author>
          <author num="006">
            <authorCodes>
              <orcid>0000-0001-9792-045X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Mukhin</surname>
              <initials>Ivan</initials>
              <email>muhin_is@spbstu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">The formation of single-domain gallium phosphide buffer layers on a silicon substrate without the use of migration enhanced epitaxy technique</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In the paper, the influence of growth factors and silicon surface condition on the epitaxial formation of single-domain GaP buffer layers on Si (001) has been studied. A novel two-stage growth technique for the epitaxial building-up of this structure has been put forward and developed. In contrast to using the migration enhanced epitaxy technique, the proposed technology allows one to separate the nucleation and growth stages, to control the doping profile of the GaP buffer layers. The latter is important for further functional applications. The main factors determining the orientation of GaP crystalline lattice when it nucleates on the Si vicinal surface were found. The structural perfection of the grown buffer layers at both stages was proved through careful control by TEM, RHEED, AFM, and HRXRD. These findings have important implications for further functional applications.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17209</doi>
          <udk>539.23</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>heterostructure</keyword>
            <keyword>molecular beam epitaxy</keyword>
            <keyword>buffer layer</keyword>
            <keyword>gallium phosphide</keyword>
            <keyword>silicon substrate</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.9/</furl>
          <file>09_120-133_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>134-140</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Tretyakov</surname>
              <initials>Artem</initials>
              <email>tretartem@gmail.com</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <researcherid>E-4237-2014</researcherid>
              <scopusid>12784708700</scopusid>
              <orcid>0000-0001-9050-4453</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Kapralova</surname>
              <initials>Victoria</initials>
              <email>kapralova2006@yandex.ru</email>
              <address>Russia, 195251, St.Petersburg, Polytechnicheskaya, 29</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University </orgName>
              <surname>Loboda</surname>
              <initials>Vera</initials>
              <email>vera_loboda@mail.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0001-7579-7577</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute of Macromolecular Compounds</orgName>
              <surname>Sapurina</surname>
              <initials>Irina</initials>
              <email>sapurina@mail.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Sudar</surname>
              <initials>Nikolai</initials>
              <email>sudar53@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Effect of doping agent evaporation on thermoelectric properties of carbon nanotube–polyaniline composite</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The paper presents the results of experimental study of the influence of the doping agent (acid) nature on the conductivity, Seebeck coefficient, and thermoelectric power factor of composite material based on multilayer carbon nanotubes coated with polyaniline. Polyaniline was deposited on carbon nanotube surfaces by heterophase synthesis (in-situ polymerization), by oxidative polymerization of aniline in the presence of nanotubes dispersed in the reaction medium. Hydrochloric, camphorsulfonic and dodecylbenzenesulfonic acids were used as doping agents. The effect of temperature on the conductivity, Seebeck coefficient and thermoelectric power factor of the investigated composite materials has been studied in the range from 300 to 410 K. Comparison of the influence of the acid volatility on the changes in these parameters in the heating-cooling cycle allowed us to conclude that the decrease in conductivity and increase in the Seebeck coefficient when heating composites doped with different acids is caused by the acid removal from the samples.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17210</doi>
          <udk>53.06</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>thermoelectrics</keyword>
            <keyword>conducting polymers</keyword>
            <keyword>carbon nanotubes</keyword>
            <keyword>conductivity</keyword>
            <keyword>Seebeck coefficient</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.10/</furl>
          <file>10_134-140_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>141-149</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0009-0000-5779-9966</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Ioffe Institute of RAS</orgName>
              <surname>Semenov</surname>
              <initials>Sergey</initials>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">The temperature effect on impulse dielectric strength of polymer films</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In the paper, the experimental data on the temperature effect on the breakdown strength of polypropylene, polycarbonate and poly(ethylene terephthalate) films 2.0–2.5 μm thick have been obtained over a temperature range from 293 to 363 K. When the film samples were heated, the breakdown electric field strength was found to decrease slightly but to reveal a significant scatter of values. It was shown that the experimental results on the pulsed electrical breakdown of the polymer films could be described basing the notion of the ionization mechanism of the polymer breakdown, not related to the development of an impact ionization of the polymer molecules.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17211</doi>
          <udk>53.043</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>impulse dielectric strength</keyword>
            <keyword>temperature</keyword>
            <keyword>polypropylene</keyword>
            <keyword>polycarbonate</keyword>
            <keyword>poly(ethylene terephthalate)</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.11/</furl>
          <file>11_141-149_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>150-159</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0003-2770-2304</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Sonora University, Department of Investigation for Physics, Hermosillo, Mexico</orgName>
              <surname>Lipovka</surname>
              <initials>Anton</initials>
              <email>nila_lip@mail.ru</email>
              <address>83000, Mexico, Calle Rosales e Boulevard Luis, Encinas s/n Colonia Centro, Hernosillo</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-1655-9242</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Southern Adventist University, School of Engineering and Physics</orgName>
              <surname>Andrianarijaona</surname>
              <initials>Vola</initials>
              <email>avola@southern.edu</email>
              <address>PO Box 370, Collegedale, TN 37315-0370, USA</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0003-4348-7923 </orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Southern Adventist University, School of Engineering and Physics</orgName>
              <surname>Davis </surname>
              <initials>Colton </initials>
              <email>coltondavis@southern.edu</email>
              <address>PO Box 370, Collegedale, TN 37315-0370, USA</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Derivation of the Klein – Gordon – Fock equation from first principles</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this paper, the Klein – Gordon – Fock equation is derived from the first principles. There is no need to postulate the existence of wave functions or to axiomatically introduce values of equation coefficients within the framework of the applied approach. The equation was derived on an adiabatically variable manifold, locally described by the FRW metric with complete electrodynamics constructed on it. Here the transverse electromagnetic field (TEMF) is quantized due to the adiabatic change in the metric tensor and the Planck constant acts as an adiabatic invariant of the TEMF. Moreover, the wave functions appear in the equations in a natural way, being eigenfunctions of the Sturm – Liouville problem. These are the functions in which the TEMF function is expanded. To summarize, the proposed approach makes obvious the physical meaning both of the equation itself and of quantum mechanics in general.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17212</doi>
          <udk>530.145.85</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>Klein – Gordon – Fock equation</keyword>
            <keyword>Schrödinger equation</keyword>
            <keyword>Sturm – Liouville problem</keyword>
            <keyword>quantization of electromagnetic field</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.12/</furl>
          <file>12_150-159_17(2)2024.pdf</file>
        </files>
      </article>
      <article>
        <artType>RAR</artType>
        <langPubl>RUS</langPubl>
        <pages>160-173</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Department of Physics, Tri-Chandra Multiple College, Tribhuvan University</orgName>
              <surname>Khadka </surname>
              <initials>Chandra</initials>
              <email>chandrabahadur9988@gmail.com</email>
              <address>Kathmandu, Nepal</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Formulation of the Lorentz transformation equations in the three dimensions of space</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The Lorentz transformation of space and time between two inertial frames of reference is one of the pillars of the special theory of relativity. Until now, the Lorentz transformation equations have been considered on the base of one-dimensional motion between the inertial frames. The goal of this article is to extend the ordinary one-dimensional Lorentz transformation to motion along X-, Y-, and Z-directions, i.e., to achieve a space-time coordinate transformation in the three-dimensional (3D) space. We particularly discovered the modified Lorentz transformation equations along 3 directions, and this helped us to analyze the space contraction phenomena of a cuboid due to the relative motion between the inertial frames in the 3D space. As a final point, this study concluded that all length, breadth and height of a cuboid appeared to be shortened to the observer if there is the relative motion between the cuboid and an observer in the 3D space.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.17213</doi>
          <udk>510.10</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>frame of reference</keyword>
            <keyword>Lorentz transformation</keyword>
            <keyword>space contraction</keyword>
            <keyword>special relativity theory</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2024.73.13/</furl>
          <file>13_160-173_17(2)2024.pdf</file>
        </files>
      </article>
    </articles>
  </issue>
</journal>
