<?xml version="1.0" encoding="utf-8"?>
<journal>
  <titleid/>
  <issn>2304-9782, 2618-8686, 2405-7223</issn>
  <journalInfo lang="ENG">
    <title>St. Petersburg Polytechnic University Journal: Physics and Mathematics</title>
  </journalInfo>
  <issue>
    <volume>16</volume>
    <number>3.1</number>
    <altNumber> </altNumber>
    <dateUni>2023</dateUni>
    <pages>1-479</pages>
    <articles>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>10-15</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Voronezh State University of Engineering Technology</orgName>
              <surname>Kim </surname>
              <initials>Kseniya </initials>
              <email>kmkseniya@yandex.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Voronezh State University of Engineering Technology</orgName>
              <surname>Niftaliev</surname>
              <initials>Sabukhi</initials>
              <email>sabukhi@gmail.com</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Voronezh State University of Engineering Technology</orgName>
              <surname>Kotov</surname>
              <initials>Gennady</initials>
              <email>giktv@mail.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Voronezh State University of Engineering Technology</orgName>
              <surname>Lenshin</surname>
              <initials>Alexander</initials>
              <email>lenshinas@mail.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">The features in the formation of oxide porous structures based on SiO2–SnOх</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Substrates of the present gas-sensible sensors are fabricated from the porous silicon characterized by a high specific surface. In order to increase stability of the operation and enhance selectivity of these sensors their surface can be covered with metal-containing films. In this work the film of tin oxide was deposited on the surface of porous silicon; this films is characterized by certain advantages such as a wide band gap, low price, high sensibility and in-toxicity of the material. Porous silicon was obtained by electrochemical anodizing of single-crystalline silicon (grade KEF (100)). Porous silicon samples werethen coated with the films of tin oxide applying thermal evaporation in vacuum. When metal-oxide film was deposited on porous silicon its surface became more textured and in addition formation of the great amount of nano-scale granules could be observed. Optical properties of the samples were studied by UV-spectroscopy. The presence of the oxidized tin was found on the surface of porous silicon in the form of SnO. It was shown that thermal deposition of tin on the surface of porous silicon resulted in the change of position and shape of the photoluminescence band. Results presented in the work demonstrated that thermal evaporation in vacuum can be successfully applied for obtaining of the tin oxide films on porous silicon. The elaborated nanocomposites can be used for the fabrication of sensors for gas detection.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.101</doi>
          <udk>546.3-126:544.2</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>porous silicon</keyword>
            <keyword>tin oxide</keyword>
            <keyword>thermal evaporation in vacuum</keyword>
            <keyword>photoluminescence</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.1/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>16-20</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>M.N. Mikheev Institute of Metal Physics, UB RAS</orgName>
              <surname>Chistyakov</surname>
              <initials>Vasiliy</initials>
              <email>wchist@imp.uran.ru</email>
              <address>Ekaterinburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>M.N. Mikheev Institute of Metal Physics, UB RAS</orgName>
              <surname>Perevalova</surname>
              <initials>Aleksandra</initials>
              <email>domozhirova@imp.uran.ru</email>
              <address>Ekaterinburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>M.N. Mikheev Institute of Metal Physics; Ural Federal University</orgName>
              <surname>Fominykh </surname>
              <initials>Bogdan </initials>
              <email>fominykh@imp.uran.ru</email>
              <address>Ekaterinburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>National Cheng Kung University</orgName>
              <surname>Huang </surname>
              <initials>J. C. A.</initials>
              <email>jcahuang@mail.ncku.edu.tw</email>
              <address>Tainan, Taiwan</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>M.N. Mikheev Institute of Metal Physics; Ural Federal University</orgName>
              <surname>Marchenkov</surname>
              <initials>Vyacheslav</initials>
              <address>Ekaterinburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Hall Effect in “size” topological insulators Bi2Se3</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The Hall resistance ρxy of thin films of the Bi2Se3 topological insulator with a thickness from 10 nm to 75 nm at a temperature of 4.2 K and in magnetic fields up to 10 T has been measured. The size effect was found, i.e. dependence of the Hall resistance and the Hall coefficient on the thickness of the studied films. Using a single-band model, the values of the current carrier concentration and their mobility are calculated, which also change with a change in the thickness of the samples.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.102</doi>
          <udk>669.765:537.312.6</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>topological insulators</keyword>
            <keyword>size effect</keyword>
            <keyword>Hall Effect</keyword>
            <keyword>thin films</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.2/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>21-25</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Smirnova </surname>
              <initials>Maria </initials>
              <email>masha_19957@mail.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Bachurin</surname>
              <initials>Vladimir</initials>
              <email>vibachurin@mail.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>P.G. Demidov Yaroslavl State University</orgName>
              <surname>Pukhov </surname>
              <initials>Denis</initials>
              <email>puhov2005@ya.ru</email>
              <address>Yaroslavl, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Mazaletsky</surname>
              <initials>Leonid</initials>
              <email>boolvinkl@ya.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>P.G. Demidov Yaroslavl State University</orgName>
              <surname>Lebedev</surname>
              <initials>Michael</initials>
              <email>m.e.lebedev@ya.ru</email>
              <address>Yaroslavl, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Churilov</surname>
              <initials>Anatoly</initials>
              <email>abchurilov@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Development of the surface morphology of germanium upon irradiation with gallium ions</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Experimental studies of the germanium surface morphology development under irradiation with a focused gallium ion beam at different angles of incidence and fluences are presented. It is shown that a nanoporous structure formes in the near-surface layer starting with a dose of 5·1015 cm‒2.This leads to the formation of a sponge-like morphology with a wall thickness of about 20 nm and a depth up to 150 nm with an increasing dose. Changing the ion beam incidence angle with respect to the surface normal leads to a tilt of the pores walls in the collinear direction.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.103</doi>
          <udk>537.534</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>semiconductor</keyword>
            <keyword>Ge</keyword>
            <keyword>ion irradiation</keyword>
            <keyword>surface morphology</keyword>
            <keyword>pores</keyword>
            <keyword>sponge-like relief</keyword>
            <keyword>angle dependence</keyword>
            <keyword>dose dependence</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.3/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>26-30</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0001-7499-0578</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute of High Current Electronics, Siberian Branch of RAS</orgName>
              <surname>Kozhevnikov</surname>
              <initials>Vasily</initials>
              <email>Vasily.Y.Kozhevnikov@ieee.org</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Institute of High Current Electronics, Siberian Branch, RAS</orgName>
              <surname>Oskirko</surname>
              <initials>Vladimir</initials>
              <email>oskirkovo@gmail.com</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Institute of High Current Electronics, Siberian Branch, RAS</orgName>
              <surname>Rabotkin</surname>
              <initials>Sergey</initials>
              <email>rabotkin@yandex.ru</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Institute of High Current Electronics, Siberian Branch, RAS</orgName>
              <surname>Pavlov</surname>
              <initials>Artem</initials>
              <email>apel4pap@gmail.com</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Institute of High Current Electronics, Siberian Branch, RAS</orgName>
              <surname>Semenov</surname>
              <initials>Vyacheslav</initials>
              <email>semenofvjacheslav@gmail.com</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Soloviev</surname>
              <initials>Andrei</initials>
              <email>asus_work@mail.ru</email>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>Institute of High Current Electronics, Siberian Branch, RAS</orgName>
              <surname>Grenadyorov</surname>
              <initials>Alexander</initials>
              <email>1711sasha@mail.ru</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <orgName>Institute of High Current Electronics, Siberian Branch, RAS</orgName>
              <surname>Zakharov</surname>
              <initials>Alexander</initials>
              <email>zare17@yandex.ru</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Novel methods for synthesizing high-quality thin films through short and ultrashort high-power pulsed magnetron sputtering</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The present study focuses on investigating the increase in average ion current density to the substrate in short and ultra-short high-power impulse magnetron sputtering (HiPIMS). Theoretical and experimental evidence demonstrates that, while maintaining the average power level of HiPIMS, the ultra-short mode enables a more than threefold increase in the ion current density of the target material onto the substrate. These findings hold promise for enhancing the quality of HiPIMS ion-plasma vapor deposition (IPVD) coatings.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.104</doi>
          <udk>533.9.02</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>high-power impulse magnetron sputtering</keyword>
            <keyword>plasma vapor deposition</keyword>
            <keyword>thin films</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.4/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>31-35</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>National Research University of Electronic Technology</orgName>
              <surname>Vasilevsky </surname>
              <initials>Pavel </initials>
              <email>pavelvasilevs@yandex.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>National Research University of Electronic Technology</orgName>
              <surname>Savelyev</surname>
              <initials>Mikhail</initials>
              <email>nanonlin@yandex.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Federal Research Center of Problems of Chemical Physics and Medicinal Chemistry RAS</orgName>
              <surname>Tolbin</surname>
              <initials>Alexander</initials>
              <email>tolbin@inbox.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>I.M. Sechenov First Moscow State Medical University</orgName>
              <surname>Ryabkin</surname>
              <initials>Dmitrii</initials>
              <email>ryabkin@bms.zone</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>National Research University of Electronic Technology</orgName>
              <surname>Gerasimenko</surname>
              <initials>Alexander</initials>
              <email>gerasimenko@bms.zone</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Spatial self-phase modulation of light in liquid dispersions based on conjugates of phthalocyanines and carbon nanotubes</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The growth in the power of laser systems makes the problem of protecting photosensitive elements of optical systems and visual organs from high-intensity radiation an urgent issue. This work explores the possibility of optical limitation of quasi-continuous laser radiation using liquid dispersions of conjugates of phthalocyanines and carbon nanotubes. It has been found that the laser beam passes through the studied materials unchanged at low power (&lt; 100 mW), and then begins to expand with the appearance of an interference pattern. The use of a limiting diaphragm makes it possible to block part of the laser radiation, which leads to the attenuation of the laser radiation passed through the “sample-diaphragm” system. This phenomenon can be used to protect light-sensitive elements in optical systems.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.105</doi>
          <udk>535.015</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>laser radiation</keyword>
            <keyword>carbon nanotubes</keyword>
            <keyword>phthalocyanines</keyword>
            <keyword>spatial self-phase modulation</keyword>
            <keyword>optical limiting</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.5/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>36-40</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Buzakov</surname>
              <initials>Mikhail</initials>
              <email>mikhail.buzakov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Smirnov </surname>
              <initials>Vyacheslav </initials>
              <email>obieshkaplayer@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Sennikova </surname>
              <initials>Daria</initials>
              <email>daria.sennikova@yandex.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Molodtsova </surname>
              <initials>Anastasia </initials>
              <email>a.molodtsova@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Rozenblit </surname>
              <initials>Alina </initials>
              <email>alina.rozenblit@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>University of Amsterdam</orgName>
              <surname>Porvatov </surname>
              <initials>Vadim </initials>
              <email>eighonet@gmail.com</email>
              <address>Amsterdam, Netherlands</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Burmistrov </surname>
              <initials>Oleg </initials>
              <email>oleg.burmistrov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Puhtina</surname>
              <initials>Ekaterina</initials>
              <email>ekaterina.puhtina@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="009">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Dmitriev </surname>
              <initials>Alexey </initials>
              <email>alexey.dmitriev@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="010">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Olekhno </surname>
              <initials>Nikita </initials>
              <email>nikita.olekhno@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Crystallization of robotic swarms in a parabolic potential</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Large ensembles of particles converting their internal energy resources into mechanical motion form a class of systems denoted as active matter. Such systems demonstrate a wide range of interesting phenomena, including self-organization and phase transitions emerging in biological and artificial active matter. One of the popular platforms for experimental realization of such systems are swarms of simple moving robots. In the present work, we consider a swarm of self-propelled robots with a stadium-like shape placed in a parabolic potential and address the dynamics of crystallization in this non-equilibrium system. To quantify the formation of hexagonal crystals, we evaluate the average cluster size and six-fold parameter characterizing the hexatic ordering directly from the experimental data.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.106</doi>
          <udk>544.015.4</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>crystallization</keyword>
            <keyword>self-organization</keyword>
            <keyword>active matter</keyword>
            <keyword>swarm robotics</keyword>
            <keyword>self-propelled particles</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.6/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>41-46</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Balakirev</surname>
              <initials>Sergey</initials>
              <email>sbalakirev@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Kirichenko </surname>
              <initials>Danil </initials>
              <email>dankir@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Shandyba </surname>
              <initials>Nikita </initials>
              <email>shandyba.nikita@gmail.com</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Chernenko </surname>
              <initials>Natalia</initials>
              <email>nchernenko@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <surname>Solodovnik</surname>
              <initials>Maxim</initials>
              <email>solodovnikms@sfedu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Droplet epitaxy of site-controlled In/GaAs(001) nanostructures with a variable distance: experiments and simulations</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">This paper presents a complex experimental and theoretical study of the droplet epitaxial growth of In/GaAs(001) nanostructures on patterned surfaces. We observe that holes formed after GaAs overgrowth of surfaces treated with a focused ion beam are the preferred centers for the nucleation of In droplets at any temperature in a range from 250 °C to 350 °C. Good selectivity and localization of droplets are achieved along a square perimeter of holes located at a distance from 0.5 to 4.2 µm apart. However, lower temperatures are required to provide filling of more holes and formation of an ordered array of droplet pairs. Using kinetic Monte Carlo simulations, we demonstrate growth conditions which allow filling of all holes located at variable distances in a range from 20 to 340 nm and avoiding unnecessary nucleation beyond the holes.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.107</doi>
          <udk>538.9.</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>droplet epitaxy</keyword>
            <keyword>focused ion beams</keyword>
            <keyword>patterned surfaces</keyword>
            <keyword>Monte Carlo method</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.7/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>47-52</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>St. Petersburg Electrotechnical University "LETI"</orgName>
              <surname>Chumanov </surname>
              <initials>Ivan </initials>
              <email>chumanov2000@yandex.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>St. Petersburg Electrotechnical University "LETI"</orgName>
              <surname>Firsov</surname>
              <initials>Dmitrii</initials>
              <email>d.d.firsov@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Ioffe Institute</orgName>
              <surname>Solov'ev</surname>
              <initials>Viktor</initials>
              <email>vasol@beam.ioffe.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Ioffe Institute</orgName>
              <surname>Chernov</surname>
              <initials>Mikhail</initials>
              <email>chernov@beam.ioffe.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>St. Petersburg Electrotechnical University "LETI"</orgName>
              <surname>Komkov </surname>
              <initials>Oleg </initials>
              <email>oleg_sergeevich@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Temperature dependence of the energy spectrum of metamorphic InSb/In(Ga,Al)As/GaAs heterostructures studied using FTIR photoreflectance spectroscopy</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The paper presents the results of studies of InSb/In(Ga,Al)As/GaAs heterostructures using the photoreflectance method. Based on the results of the work, the temperature dependences of the observed transition energies were obtained, the values of the miniband width and spin-orbit splitting were determined.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.108</doi>
          <udk>538.958</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>heterostructures</keyword>
            <keyword>superlattices</keyword>
            <keyword>quantum wells</keyword>
            <keyword>photoreflectance method</keyword>
            <keyword>semiconductors</keyword>
            <keyword>FTIR spectroscopy</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.8/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>53-58</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Lakhina </surname>
              <initials>Ekaterina </initials>
              <email>lakhina@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Shandyba </surname>
              <initials>Nikita </initials>
              <email>shandyba.nikita@gmail.com</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Chernenko </surname>
              <initials>Natalia</initials>
              <email>nchernenko@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Kirichenko </surname>
              <initials>Danil </initials>
              <email>dankir@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <surname>Balakirev</surname>
              <initials>Sergey</initials>
              <email>sbalakirev@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Solodovnik</surname>
              <initials>Maxim</initials>
              <email>solodovnikms@sfedu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Formation of symmetrical nanoholes by local droplet etching for site-controlled growth of single quantum dots</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this paper, we study local etching of the GaAs(001) surface by Ga droplets at various technological conditions. Effects of the deposition temperature and thickness, interruption time, annealing temperature and arsenic background pressure are discussed. A minimum deposition thickness of 1.5 monolayer of Ga is found to be sufficient to etch the GaAs surface. We demonstrate that an increase in the annealing temperature leads to a decrease in the hole depth and an increase in their diameter. For the first time, we obtain symmetrical nanoholes of pyramidal shape on the GaAs(001) surface with a low surface density (~ 1·108 cm‒2 and below) allowing subsequent formation of single quantum dots for high-efficiency quantum photonic devices.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.109</doi>
          <udk>538.9.</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>epitaxy</keyword>
            <keyword>local droplet etching</keyword>
            <keyword>gallium arsenide</keyword>
            <keyword>A3B5</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.9/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>59-63</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Tatarinov </surname>
              <initials>Dmitry </initials>
              <email>dmitry.tatarinov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-1793-6812</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Skolkovo Institute of Science and Technology</orgName>
              <surname>Pushkarev</surname>
              <initials>Anatoly</initials>
              <email>anatoly.pushkarev@metalab.ifmo.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-9257-6183</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Makarov</surname>
              <initials>Sergey</initials>
              <email>s.makarov@metalab.ifmo.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Optimization of triple-cation perovskite thin films by PEAI additive</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">This work presents an additive engineering approach to prepare structurally stable highly crystalline triple-cation and mixed-anion perovskite thin film by using 5 mol% doping of perovskite solution with phenethylammonium iodide (PEAI). Such an additive provides increase in grain size up to 20 % and preserves surface morphology of non-encapsulated films for at least 6 months at ambient conditions. Stability experiments showed excellent results for films with PEAI additive, which confirmed by X-ray diffraction measurements. The additive strategies have great potential to improve the power conversion efficiency and the long-term stability of the perovskite solar cell suitable for commercialization.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.110</doi>
          <udk>53.093</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>halide perovskites</keyword>
            <keyword>additive engineering</keyword>
            <keyword>surface morphology</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.10/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>64-68</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Chernenko </surname>
              <initials>Natalia</initials>
              <email>nchernenko@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>National Research University ‘Higher School of Economics”</orgName>
              <surname>Makhov</surname>
              <initials>Ivan</initials>
              <email>imahov@hse.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Balakirev</surname>
              <initials>Sergey</initials>
              <email>sbalakirev@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Kirichenko </surname>
              <initials>Danil </initials>
              <email>dankir@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <surname>Shandyba </surname>
              <initials>Nikita </initials>
              <email>shandyba.nikita@gmail.com</email>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Kryzhanovskaya Natalia V.</surname>
              <initials>Natalia</initials>
              <email>nkryzhanovskaya@hse.ru</email>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <surname>Solodovnik</surname>
              <initials>Maxim</initials>
              <email>solodovnikms@sfedu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Study of InAs/GaAs quantum dots formation in subcritical growth modes on patterned substrates</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this work we present the results of experimental studies of the InAs/GaAs quantum dot formation in subcritical growth modes on nanopatterned substrates. For this purpose, we used two ways for surface patterning: local droplet etching and modified oxide desorption technique. We have experimentally shown that both methods allow in situ formation of nanosized pits (or nanoholes) on the surface, but their shape and density is quite different. We also have shown that the using of growing surface nanopatterning allows both to obtain self-assembled nanostructures (including QD) at subcritical deposition thicknesses and to localize its formation in nanoholes with high selectivity and suppressing a wetting layer formation. In addition, our results have also shown that the nanohole character on a structured surface (shape, size, density) has a key effect on both the processes of nanostructure nucleation and growth and their structural and optical properties, which should also be taken into account when developing methods for creating heterostructures with regular arrays of quantum dots.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.111</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>quantum dot</keyword>
            <keyword>A3B5</keyword>
            <keyword>wetting layer</keyword>
            <keyword>nanopatterning</keyword>
            <keyword>molecular beam epitaxy</keyword>
            <keyword>nanostructure</keyword>
            <keyword>self-organization</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.11/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>69-73</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Shibalov</surname>
              <initials>Maksim</initials>
              <email>maxshibalov@gmail.com</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Sirotina</surname>
              <initials>Anna</initials>
              <email>ansipe@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Pershina</surname>
              <initials>Elena</initials>
              <email>squirrel_red@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Shibalova</surname>
              <initials>Anastasia</initials>
              <email>shibalova.a@inme-ras.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Mumlyakov</surname>
              <initials>Alexander</initials>
              <email>mumlyakov.a@inme-ras.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Porokhov</surname>
              <initials>Nikolay</initials>
              <email>porokhov.n@inme-ras.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <surname>Tarkhov</surname>
              <initials>Michael</initials>
              <email>tmafuz@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Properties of ultrathin epitaxial NbNx film on C-cut sapphire</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Here we report on the results of obtaining and study of epitaxial ultrathin superconductive films of niobium nitride grown on a C-plane sapphire substrate. The films were deposited from metal-organic precursor using the plasma-enhanced atomic layer deposition. We employed X-ray diffraction, and high-resolution transmission electron microscopy techniques to study the structural properties of the films. We also determined the quasiparticle diffusion constant, the coherence length, the superconducting transition temperature, the critical current density, and the non-uniformity of the resistance distribution of niobium nitride films.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.112</doi>
          <udk>538.945</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>atomic layer deposition</keyword>
            <keyword>niobium nitride</keyword>
            <keyword>epitaxy</keyword>
            <keyword>superconductivity</keyword>
            <keyword>critical current density</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.12/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>74-78</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Kirichenko </surname>
              <initials>Danil </initials>
              <email>dankir@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Chernenko </surname>
              <initials>Natalia</initials>
              <email>nchernenko@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Shandyba </surname>
              <initials>Nikita </initials>
              <email>shandyba.nikita@gmail.com</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Balakirev</surname>
              <initials>Sergey</initials>
              <email>sbalakirev@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <surname>Solodovnik</surname>
              <initials>Maxim</initials>
              <email>solodovnikms@sfedu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Study of arsenic flux effect on thermal desorption of GaAs native oxide and surface morphology</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this paper we presents the results of studying the molecular arsenic flux effect on the processes of native oxide thermal desorption and the resulting surface morphology of GaAs(001) substrates. We have shown that the exposure of GaAs under As flux at the stage of oxide removal significantly modulates the decomposition of native oxide and its chemical interaction with substrate materials. Based on the obtained experimental results and analysis of possible chemical reaction in this system we have shown that in the presence of arsenic molecules on the surface, free gallium atoms bind with it and no longer participate in the decomposition of native oxide components. This leads to additional decomposition of the substrate materials as a result of its etching. As a result, nanoholes of lower density, but larger in size, are formed on the surface. We have also shown that a decrease in the oxide thickness leads to a decrease in the density and dimensions of the nanoholes.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.113</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>native oxide desorption</keyword>
            <keyword>gallium arsenide</keyword>
            <keyword>native oxide</keyword>
            <keyword>molecular beam epitaxy</keyword>
            <keyword>A3B5</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.13/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>79-83</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Shandyba </surname>
              <initials>Nikita </initials>
              <email>shandyba.nikita@gmail.com</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Kirichenko </surname>
              <initials>Danil </initials>
              <email>dankir@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Chernenko </surname>
              <initials>Natalia</initials>
              <email>nchernenko@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Sharov</surname>
              <initials>Vladislav</initials>
              <email>vl_sharov@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <surname>Balakirev</surname>
              <initials>Sergey</initials>
              <email>sbalakirev@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Solodovnik</surname>
              <initials>Maxim</initials>
              <email>solodovnikms@sfedu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Effect of ion dose and accelerating voltage during focused ion beam Si(111) surface treatment on GaAs nanowires growth</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Experimental studies of the effect of dose and accelerating voltage during ion beam treatment of the Si(111) surface on the substrate structure and growth processes of GaAs nanowires have been carried out. For this purpose, arrays of areas were created on the Si(111) surface by ion beam treatment using an all-over template with variation of accelerating voltage in the range of 10–30 kV and dose in the range of 0.01–10.4 pC/µm2. Based on the results of the modified surface study after GaAs nanowire growth, the dependences of the main nanowire characteristics (density, length and diameter) on the ion beam dose were obtained. It is shown that the main influence on the formed nanowire characteristics is exerted by the dose of embedded Ga-ions. By changing the value of this ion beam parameter together with the high-temperature annealing, the chemical composition and morphology of the surface silicon oxide layer can be locally controlled, thereby predetermining the parameters of the growing nanowire array. In this case, the accelerating voltage, and, hence, the distribution of ions in the near-surface layer, is of secondary importance during all-over template processing. This is confirmed by the formation of identical nanowire arrays at different accelerating voltages since the growth of nanowires occurs under the same conditions on the Si surface after the annealing stage (as confirmed by Raman spectroscopy results).</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.114</doi>
          <udk>538.975</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>nanowires</keyword>
            <keyword>gallium arsenide</keyword>
            <keyword>focused ion beam</keyword>
            <keyword>molecular beam epitaxy</keyword>
            <keyword>A3B5</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.14/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>84-89</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0001-5386-1013</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute of Automation and Control Processes, Far Eastern Branch of the RAS</orgName>
              <surname>Galkin</surname>
              <initials>Konstantin</initials>
              <email>galkinkn@iacp.dvo.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-8726-9832</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute of Automation and Control Processes, Far Eastern Branch of the RAS</orgName>
              <surname>Chernev</surname>
              <initials>Igor</initials>
              <email>igor_chernev7@mail.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Subbotin</surname>
              <initials>Evgenii </initials>
              <email>jons712@mail.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Maslov</surname>
              <initials>Andrei </initials>
              <email>maslov@iacp.dvo.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0003-4300-0070</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Kropachev</surname>
              <initials>Oleg</initials>
              <email>chernobez@gmail.com</email>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Goroshko</surname>
              <initials>Dmitrii </initials>
              <email>goroshko@iacp.dvo.ru</email>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>Institute of Automation and Control Processes FEB RAS</orgName>
              <surname>Balagan</surname>
              <initials>Semyon</initials>
              <email>simak_64@mail.ru</email>
              <address>Vladivostok, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Argunov</surname>
              <initials>Efim</initials>
              <email>efim.argunov@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="009">
            <individInfo lang="ENG">
              <orgName>Rzhanov Institute of Semiconductor Physics Siberian Branch of RAS</orgName>
              <surname>Gutakovsky</surname>
              <initials>Anton</initials>
              <email>gut@isp.nsc.ru</email>
              <address>Novosibirsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="010">
            <authorCodes>
              <orcid>0000-0003-4127-2988</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute of Automation and Control Processes, Far Eastern Branch of the RAS</orgName>
              <surname>Galkin</surname>
              <initials>Nikolay</initials>
              <email>galkin@iacp.dvo.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Ultrathin Cr and Fe monosilicides on Si(111) substrate: formation, optical and thermoelectrical properties</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this study, the formation, crystal structure, optical and thermoelectric properties of ultrathin (UT) films of iron and chromium monosilicides are considered, which exhibit optical and thermoelectric properties characteristic of semimetals with a low density of states near the Fermi level and the main contribution of holes to the Seebeck coefficient in the temperature range 120–400 K and the transition to its negative values at T &gt; 400 K. The power factor for FeSi and CrSi UT films versus temperature was calculated and ab initio calculations of the phonon structure and thermal conductivity for bulk FeSi and its nanowires were carried out, which made it possible to estimate the thermoelectric figure of merit of ultrathin FeSi films.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.115</doi>
          <udk>539.23+535.39+537.32</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>silicon</keyword>
            <keyword>Cr and Fe monosilicides</keyword>
            <keyword>ultrathin films</keyword>
            <keyword>crystal structure</keyword>
            <keyword>optical functions</keyword>
            <keyword>thermoelectric properties</keyword>
            <keyword>power factor</keyword>
            <keyword>ab initio calculation</keyword>
            <keyword>thermal conductivity</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.15/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>90-93</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Baeva  </surname>
              <initials>Maria</initials>
              <email>maria.baeva111@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Furasova</surname>
              <initials>Aleksandra</initials>
              <email>aleksandra.furasova@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-8661-4083</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Mozharov</surname>
              <initials>Alexey</initials>
              <email>mozharov@spbau.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Tonkaev </surname>
              <initials>Pavel </initials>
              <email>pavel.tonkaev@metalab.ifmo.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Hybrid Perovskite/GaP nanowires solar cells with enhanced photovoltaic performance</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this work we report an improved photovoltaic performance of hybrid halide perovskite solar cell with integrated into a active layer GaP nanowires. The incorporation of GaP nanowires improves charge extraction from a perovskite layer. As a consequence, we boost the MAPbI3 perovskite solar cell efficiency up to 18.8% by open-circuit voltage and short-circuit current density enhancement. The provided multi-physical theoretical simulations of the solar cells with the incorporated GaP nanowires describe the mechanism of charge extraction and optical absorption improvement.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.116</doi>
          <udk>53.06</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>perovskite solar cells</keyword>
            <keyword>GaP nanowires</keyword>
            <keyword>electric field management</keyword>
            <keyword>photon management</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.16/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>94-99</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Baeva  </surname>
              <initials>Maria</initials>
              <email>maria.baeva111@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Gets</surname>
              <initials>Dmitry</initials>
              <email>smart_insuIator@mail.n.i</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Polushkin</surname>
              <initials>Artem</initials>
              <email>artem.polushkin@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Vorobyev </surname>
              <initials>Alexandr </initials>
              <email>alex.spbau@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Light-emitting and light-detecting perovskite electrochemical cell on silicon</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Here we report on a novel architecture of inorganic perovskite light-emitting and light-detecting electrochemical cell formed on silicon substrate. The cell’s active material layer consists of a composite material made: halide perovskite (CsPbBr3) microcrystals, polymer support matrix (poly(ethylene oxide)), and added mobile ions (Li+). The proposed device emits light of 7000 cd/m2 and electroluminescence efficiency of 1.3∙105 lm/W at 523 nm. The light-detecting property of the device is characterized by sensitivity up to 0.75 A/W, specific detectivity of 8.56∙1011 Jones, and linear dynamic range of 48 dB. Moreover, since the device fabricated is fabricated on a silicon substrate it exhibits 40% lower Joule heating compared to the perovskite optoelectronic devices fabricated on conventional ITO/glass substrates.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.117</doi>
          <udk>53.06</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>composite inorganic halide perovskite</keyword>
            <keyword>silicon</keyword>
            <keyword>light-emitting electrochemical cell</keyword>
            <keyword>photodetector</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.17/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>100-105</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Voronezh State University of Engineering Technology</orgName>
              <surname>Lenshin</surname>
              <initials>Alexander</initials>
              <email>lenshinas@mail.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Voronezh State University</orgName>
              <surname>Peshkov </surname>
              <initials>Yaroslav </initials>
              <email>tangar77@mail.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Voronezh State University of Engineering Technology</orgName>
              <surname>Chernousova</surname>
              <initials>Olga</initials>
              <email>byolval@mail.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Voronezh State University</orgName>
              <surname>Kannykin</surname>
              <initials>Sergey</initials>
              <email>svkannykin@gmail.com</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Voronezh State University</orgName>
              <surname>Grechkina</surname>
              <initials>Margarita</initials>
              <email>grechkina_m@mail.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <authorCodes>
              <orcid>0000-0002-3956-196X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Voronezh State University</orgName>
              <surname>Minakov</surname>
              <initials>Dmitriy</initials>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>Voronezh State University</orgName>
              <surname>Zolotukhin</surname>
              <initials>Dmitriy</initials>
              <email>zolotuhin@phys.vsu.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <orgName>Voronezh State University</orgName>
              <surname>Agapov</surname>
              <initials>Boris</initials>
              <email>b.agapov2010@yandex.ru</email>
              <address>Voronezh, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">A change in the morphology of multilayer porous silicon with a stepwise decrease in the etching current density</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">We present an experimental study of multilayer porous silicon formed by electrochemical etching. Special emphasis is placed on effects that arise from a stepwise decrease in the current density while maintaining the total etching time. In order to provide a fully understanding of the morphology of the surface, we used scanning electron and atomic force microscopy. X-ray reflectivity was used to assess the porosity of porous layers. It was found that a stepwise decrease in the current density leads to the formation of a two-layer structure without changing the porosity of the base bottom layer. However, the porosity of the top layer can be varied over a wide range, which directly affects the photoluminescence of the samples. Our results show how the sample production conditions affect the fine tuning of the surface layer morphology of multilayer porous silicon.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.118</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>porous silicon</keyword>
            <keyword>multilayer nanostructures</keyword>
            <keyword>X-ray reflectivity</keyword>
            <keyword>surface morphology</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.18/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>106-111</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0002-8726-9832</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute of Automation and Control Processes, Far Eastern Branch of the RAS</orgName>
              <surname>Chernev</surname>
              <initials>Igor</initials>
              <email>igor_chernev7@mail.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Subbotin</surname>
              <initials>Evgenii </initials>
              <email>jons712@mail.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Argunov</surname>
              <initials>Efim</initials>
              <email>efim.argunov@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Kozlov</surname>
              <initials>Aleksei</initials>
              <email>kozlov.ag@dvfu.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Institute of Chemistry FEB RAS</orgName>
              <surname>Gerasimenko</surname>
              <initials>Andrey</initials>
              <email>gerasimenko@ich.dvo.ru</email>
              <address>Vladivostok, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <authorCodes>
              <orcid>0000-0003-4127-2988</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Institute of Automation and Control Processes, Far Eastern Branch of the RAS</orgName>
              <surname>Galkin</surname>
              <initials>Nikolay</initials>
              <email>galkin@iacp.dvo.ru</email>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Poliakov</surname>
              <initials>Maxim</initials>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <surname>Volkova </surname>
              <initials>Lidiya </initials>
              <email>lidiya.volkova.96@mail.ru</email>
            </individInfo>
          </author>
          <author num="009">
            <individInfo lang="ENG">
              <orgName>Institute of Nanotechnologies of Microelectronics of the RAS</orgName>
              <surname>Dudin</surname>
              <initials>Alexander</initials>
              <email>dudin.a@inme-ras.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="010">
            <individInfo lang="ENG">
              <surname>Gouralnik</surname>
              <initials>Alexander</initials>
              <email>fun_era@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Mg2Si film on Si(111) prepared by Ultra-Fast Mg reactive deposition: crystal structure and thermoelectric properties</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The Mg2Si film (~ 800 nm thick) was grown by pulsed reactive deposition of Mg on Si(111) at 340 °C in UHV. Structural investigations by XRD, SEM and cross-sectional x-HRTEM demonstrate high crystal quality and 100% texture of the film. Thermoelectric properties of the Mg2Si film are characterized within 290–470 K. The film conductivity changes from p-type below 309 K to n-type at higher temperatures. The power factor is 0.27 mW/m×K2 at 470 K. The p-type conductivity can be associated with presence of oxygen or/and vacancies (VMg, VMg2Si).</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.119</doi>
          <udk>539.23+539.25+539.26+537.32+537.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>magnesium silicide</keyword>
            <keyword>silicon</keyword>
            <keyword>films</keyword>
            <keyword>epitaxy</keyword>
            <keyword>reactive epitaxy</keyword>
            <keyword>pulsed deposition</keyword>
            <keyword>crystal structure</keyword>
            <keyword>microscopy</keyword>
            <keyword>transport properties</keyword>
            <keyword>Seebeck coefficient</keyword>
            <keyword>power factor</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.19/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>112-116</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Kukenov</surname>
              <initials>Olzhas</initials>
              <email>okukenov@mail.ru</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Sokolov</surname>
              <initials>Arseniy</initials>
              <email>ars856570@gmail.com</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0009-0008-8052-3253</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Dirko</surname>
              <initials>Vladimir</initials>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0002-4029-8353</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Lozovoy</surname>
              <initials>Kirill</initials>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Kokhanenko  </surname>
              <initials>Andrey</initials>
              <email>kokh@mail.tsu.ru</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Effect of temperature during homoepitaxial growth of Si on Si(100) on the character of reflection high-energy electron diffraction patterns</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">To create high-quality nanostructures, it is important to understand the surface morphology for given growth parameters. The paper shows the effect of temperature on the ratio of intensities and periods corresponding to the growth of Si steps with different types of superstructure. The analysis was carried out in directions [100] and [110].</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.120</doi>
          <udk>539.27</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>molecular beam epitaxy</keyword>
            <keyword>reflection high-energy electron diffraction</keyword>
            <keyword>step-flow growth of silicon</keyword>
            <keyword>homoepitaxy</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.20/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>117-121</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Kenesbay </surname>
              <initials>Ramazan </initials>
              <email>ramazan.kenesbay.1999@gmail.com</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Miroshnichenko </surname>
              <initials>Anna </initials>
              <email>anna.miroshnichenko.sergeevna@gmail.com</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0003-4517-0807</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Mitin</surname>
              <initials>Dmitry</initials>
              <email>mitindm@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Baeva  </surname>
              <initials>Maria</initials>
              <email>maria.baeva111@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Influence of double layer PMHS/PDMS encapsulation on CsPbBr3 PeLEC properties in high humidity conditions</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this paper we describe a new method to improve properties of a perovskite light-emitting electrochemical cell (PeLEC) by double layer polymer encapsulation. Our perovskite devices include 1) CsPbBr3-poly(ethylene oxide) layer as emissive layer, 2) NiOx:Cu nanoparticles layer as hole transport layer, 3) a transparent single wall carbon nanotubes as an electrode of the structure and 4) a double layer encapsulation polymer layers. These encapsulation layers consist of metal catalyst-free cross-linked polymethylhydrosiloxane and polydimethylsiloxane Sylgard 184. After 168 hours of aging in 80% relative humidity conditions an increase in luminance and in photo luminance quantum yield of our devices was detected. Our encapsulation provides optimal exposure of water vapor on perovskite material, which improves device properties by partial phase transition of CsPbBr3 to Cs4PbBr6, which has been confirmed by X-ray diffraction method. The Cs4PbBr6 passivate CsPbBr3 crystals and then the polymethylhydrosiloxane layer does not allow agglomeration of perovskite grains. The polydimethylsiloxane layer is required as a mechanical supporting layer. The polymethylhydrosiloxane/polydimethylsiloxane encapsulation of perovskite devices reveals a promising new way of development of flexible and stretchable perovskite light-emitting devices, which can work in extreme humid conditions.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.121</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>perovskite</keyword>
            <keyword>encapsulation</keyword>
            <keyword>polysiloxanes</keyword>
            <keyword>metal-free cross-linking</keyword>
            <keyword>humidity aging</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.21/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>122-127</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Eremenko</surname>
              <initials>Mikhail</initials>
              <email>eryomenko@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Nikitina </surname>
              <initials>Larisa </initials>
              <email>larnikitina@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Southern Federal University</orgName>
              <surname>Jityaeva</surname>
              <initials>Julia</initials>
              <email>zhityaeva@sfedu.ru</email>
              <address>Taganrog, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Lakhina </surname>
              <initials>Ekaterina </initials>
              <email>lakhina@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Southern Federal University</orgName>
              <surname>Klimin</surname>
              <initials>Viktor</initials>
              <email>kliminvs@sfedu.ru</email>
              <address>Rostov-on-Don, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>Southern Federal University</orgName>
              <surname>Ageev</surname>
              <initials>Oleg</initials>
              <email>ageev@sfedu.ru</email>
              <address>Taganrog, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Effect of plasma-chemical treatment of Si(001) substrates on the subsequent epitaxial growth of GaAs</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this work, we investigated the effect of plasma-chemical treatment of silicon substrates on the subsequent epitaxial growth of GaAs. It is shown that a change in processing modes did not lead to a strong change in the root-mean-square roughness of the initial silicon surface. It was found that under the same growth conditions GaAs is formed on substrates differently depending on the silicon treatment mode: from individual crystallites with nanowires to a structure intergrown from individual crystallites. It is shown that a change in the annealing temperature significantly affects the resulting surface morphology.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.122</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>molecular beam epitaxy</keyword>
            <keyword>silicon</keyword>
            <keyword>GaAs</keyword>
            <keyword>monolithic integration</keyword>
            <keyword>plasma-chemical treatment</keyword>
            <keyword>scanning electron microscopy</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.22/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>128-132</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Moscow Pedagogical State University</orgName>
              <surname>Bondareva </surname>
              <initials>Polina </initials>
              <email>p.bondareva2016@yandex.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-6494-0147</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Pedagogical State University</orgName>
              <surname>Shein</surname>
              <initials>Kirill</initials>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Lyubchak </surname>
              <initials>Anastasia </initials>
              <email>anlyubchak@miem.hse.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0009-0008-4349-7332</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Pedagogical State University</orgName>
              <surname>Izmaylov</surname>
              <initials>Ramil</initials>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0003-1529-5326</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Prokhorov General Physics Institute, RAS</orgName>
              <surname>Rybin</surname>
              <initials>Maksim</initials>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <authorCodes>
              <orcid>0000-0003-2560-6503</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research University “Higher School of Economics”</orgName>
              <surname>Gayduchenko</surname>
              <initials>Igor</initials>
              <email>igaiduchenko@hse.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <surname>Goltsman</surname>
              <initials>Grigory </initials>
              <email>goltsman@rplab.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Sub-terahertz radiation detection using graphene noise thermometry method</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this paper we investigate a novel approach to inventing graphene-based sub-terahertz bolometers using noise thermometry. Graphene is a unique material for detecting radiation in the sub-terahertz (0.1–1 THz) and terahertz (1–10 THz) ranges due to its record low electron heat capacity and weak electron-phonon coupling. This results in sufficient heating of graphene electron system under terahertz radiation. The main challenge in the realization of graphene terahertz detectors arises due to weak graphene resistance dependence on temperature. Here, we solve this problem by measuring noise spectral density in graphene devices using lock-in amplifier technique under radiation of 0.13 THz. The measured thermal noise is directly dependent on electron temperature and can be used as detector signal as well as probe of electron temperature under sub-terahertz radiation. The obtained experimental data can be used to optimize modern graphene terahertz detectors and develop new ones.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.123</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>graphene</keyword>
            <keyword>THz detectors</keyword>
            <keyword>bolometers</keyword>
            <keyword>noise thermometry</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.23/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>133-137</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Nikitina</surname>
              <initials>Ekaterina </initials>
              <email>mail.nikitina@mail.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Berezovskaya</surname>
              <initials>Tamara</initials>
              <email>bertana@spbau.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Pirogov</surname>
              <initials>Evgeny</initials>
              <email>zzzavr@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Vasilkova </surname>
              <initials>Elena </initials>
              <email>elenvasilkov@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0003-1835-1629</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Shubina</surname>
              <initials>Kseniia</initials>
              <email>rein.raus.2010@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Sinitskaya</surname>
              <initials>Olesya</initials>
              <email>olesia-sova@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <authorCodes>
              <orcid>0000-0001-8629-2064</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Sobolev</surname>
              <initials>Maxim</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Long-term stability of GaAs-based pseudomorphic transistor heterostructures with InGaAs channel</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Variation of the electrophysical and structural parameters of GaAs-based pseudomorphic transistor heterostructures with an InGaAs channel during more than eleven-year storage in natural conditions have been investigated. It was found that the values of the electrophysical parameters remained within specified limits (taking into account measurement errors) after 11 years of storage. The structural properties (thickness and composition of the InGaAs channel) of pseudomorphic heterostructures have undergone significant changes associated with the InGaAs channel layer broadening due to atomic diffusion.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.124</doi>
          <udk>621.382.323</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>pseudomorphic transistors</keyword>
            <keyword>PHEMT heterostructures</keyword>
            <keyword>parameter stability</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.24/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>138-143</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Vershinina</surname>
              <initials>Olesya</initials>
              <email>seraia.ov@phystech.edu</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Filalova</surname>
              <initials>Emilia</initials>
              <email>filalova.em@phystech.edu</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0003-2149-4903</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Kerechanina</surname>
              <initials>Maria</initials>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Urazov</surname>
              <initials>Maxim</initials>
              <email>urazov.mn@mipt.ru</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Khramov</surname>
              <initials>Egor</initials>
              <email>Egor.Khramov@phystech.edu</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Lizunova</surname>
              <initials>Anna</initials>
              <email>anna.lizunova@gmail.com</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">The effect of laser radiation on the properties of platinum nanoparticles produced in a gas discharge</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">This study is devoted to the investigation of the effect of laser radiation of different wavelengths (355, 527 and 1054 nm) on the morphology, structure and optical properties of platinum nanoparticles synthesized in a gas discharge. The results confirmed that all three types of lasers can be used to modify platinum nanoparticles and to change their sizes. The best modification that is shape transformation from aggregates to individual nanoparticles is achieved by using an infrared laser (1054 nm). It was shown that all obtained nanoparticles have a maximum of plasmon resonance in the ultraviolet region in the wavelength range from 200 to 300 nm, which is similar to the additionally simulated calculations based on the theory of Mie absorption spectra of monodisperse platinum particles with sizes from 5 to 120 nm.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.125</doi>
          <udk>544.032.65</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>Platinum nanoparticles (Pt NPs)</keyword>
            <keyword>spark discharge</keyword>
            <keyword>laser radiation</keyword>
            <keyword>reshape</keyword>
            <keyword>plasmon resonance</keyword>
            <keyword>ultraviolet (UV)</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.25/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>144-150</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Smirnov</surname>
              <initials>Alexander</initials>
              <email>fizteh21@yandex.ru</email>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-4680-6224</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Abrukov</surname>
              <initials>Victor</initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0009-0000-6712-0291</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Platonov</surname>
              <initials>Pavel</initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0003-4860-3460</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Anufrieva</surname>
              <initials>Darya</initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0001-8645-2822</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Kokshina </surname>
              <initials>Anna </initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <authorCodes>
              <orcid>0000-0001-8974-2307</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Kazakov</surname>
              <initials>Valery</initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Petrov</surname>
              <initials>Dmitry</initials>
              <email>dimapetrovasp@yandex.ru</email>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Tyunterov </surname>
              <initials>Evgeny </initials>
              <email>tyunterov97@mail.ru</email>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="009">
            <authorCodes>
              <orcid>0000-0001-8432-5635</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Vasilyeva </surname>
              <initials>Olga </initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="010">
            <authorCodes>
              <orcid>0000-0002-9723-5652</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Ksenofontov</surname>
              <initials>Sergey</initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
          <author num="011">
            <authorCodes>
              <orcid>0000-0003-2498-1192</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>I.N. Ulyanov Chuvashia State University</orgName>
              <surname>Lepaev</surname>
              <initials>Alexander</initials>
              <address>Cheboksary, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Application of linear chain carbon films for sensitive elements of humidity sensors</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The technologies for synthesizing and the results of investigating novel relative humidity sensors are described. Films made of various metals in combination with linear-chain carbon films were used as electrodes. The study presents the results of testing the sensors for sensitivity and recovery time. Multifactor computational models were created using neural networks based on the obtained data to solve both direct and inverse experimental problems.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.126</doi>
          <udk>551.508.7</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>linear chain carbon film</keyword>
            <keyword>film electrodes</keyword>
            <keyword>silver films</keyword>
            <keyword>tin films</keyword>
            <keyword>aluminum films</keyword>
            <keyword>sensor</keyword>
            <keyword>relative humidity</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.26/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>151-156</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0002-3469-5897</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Kondratev</surname>
              <initials>Valeriy</initials>
              <email>kvm_96@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0009-0006-0923-1501</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Kozko</surname>
              <initials>Ivan</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0009-0005-0777-6746</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Karaseva</surname>
              <initials>Elizaveta</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0001-6869-1213</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Vyacheslavova</surname>
              <initials>Ekaterina</initials>
              <email>cate.viacheslavova@yandex.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0002-4110-1647</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Shugabaev</surname>
              <initials>Talgat</initials>
              <email>talgashugabaev@mail.ru</email>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Svinkin </surname>
              <initials>Nikita</initials>
              <email>nik-svinkin@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <authorCodes>
              <orcid>0000-0001-7223-7232</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Bolshakov</surname>
              <initials>Alexey</initials>
              <email>acr1235@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Towards nanowire-based selective vapor sensing with an aid of impedance spectroscopy</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">This work is aimed at development of highly sensitive silicon (Si)-based sensors allowing for selective detection and analysis of liquid solution composition containing ammonia (NH3) and hydrochloric acid (HCl) in an indirect manner. To provide enhanced sensitivity, we use Si nanowires obtained with cryogenic plasma etching with high aspect ratio providing large adsorption surface area. The nanowires are placed on a contact platform and electrochemical impedance spectroscopy (EIS) is used to detect the analytes. For optimization of the sensor performance we develop three types of the sensor based on as-fabricated Si nanowires, nanowires treated with hydrofluoric acid (HF) and nanowires decorated with silver (Ag) NPs.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.127</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>silicon</keyword>
            <keyword>sensors</keyword>
            <keyword>selective detection</keyword>
            <keyword>nanowires</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.27/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>157-162</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0009-0008-4344-4863</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Nikolaeva</surname>
              <initials>Aleksandra</initials>
              <email>nikalex2000@bk.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-3469-5897</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Kondratev</surname>
              <initials>Valeriy</initials>
              <email>kvm_96@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Kadinskaya </surname>
              <initials>Svetlana </initials>
              <email>skadinskaya@bk.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0009-0007-9013-7973</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Markina</surname>
              <initials>Diana</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0002-2209-6483</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Kochetkov</surname>
              <initials>Fedor</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Zubov</surname>
              <initials>Fedor</initials>
              <email>fzubov@hse.ru</email>
            </individInfo>
          </author>
          <author num="007">
            <authorCodes>
              <orcid>0009-0009-7051-8458</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Monastyrenko</surname>
              <initials>Anatoliy</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <authorCodes>
              <orcid>0000-0001-7223-7232</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Bolshakov</surname>
              <initials>Alexey</initials>
              <email>acr1235@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Pressure sensing with ZnO structures in PDMS matrix via impedance spectroscopy</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The work is devoted to fabrication of the mechanical pressure sensors based on zinc oxide microwires (ZnO MWs) synthesized via low-temperature hydrothermal method. The ZnO MWs were encapsulated in Poly(dimethylsiloxane) (PDMS) membrane by G-coating technique between two ceramic substrates with interdigital gold contacts. The correlation between the mechanical load applied to the sensor and its electrophysical characteristics is studied with electrical impedance spectroscopy. The results of the work are of interest for the development of pressure sensors, in particular for miniature portable flexible health monitoring systems.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.128</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>ZnO</keyword>
            <keyword>PDMS</keyword>
            <keyword>sensor</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.28/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>163-169</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>V.I. Vernadsky Crimean Federal University</orgName>
              <surname>Dzedolik</surname>
              <initials>Igor</initials>
              <email>igor.dzedolik@cfuv.ru</email>
              <address>Simferopol, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>V.I. Vernadsky Crimean Federal University</orgName>
              <surname>Tomilin</surname>
              <initials>Sergey</initials>
              <email>s.tomilin.phystech@cfuv.ru</email>
              <address>Simferopol, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0001-9381-0034</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>V.I. Vernadsky Crimean Federal University</orgName>
              <surname>Polulyakh </surname>
              <initials>Sergey </initials>
              <email>sergey.polulyakh@cfuv.ru</email>
              <address>Simferopol, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>V.I. Vernadsky Crimean Federal University</orgName>
              <surname>Yakubenko</surname>
              <initials>Bogdan</initials>
              <email>bdrujok@mail.ru</email>
              <address>Simferopol, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Logic gates based on carbon nanotubes</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The propagation of a plasmonic pulse signal in carbon nanotubes (CNTs) has been investigated theoretically, and the circuits of plasmonic logic gates “NOT” and “OR” based on CNTs have been proposed. These logic gates represent a complete functional basis for binary logic. The spatial modeling of plasmonic logic gates is performed taking into account the atomic structure of CNTs. The proposed logic gates can be used for plasmonic circuitry in the telecommunication frequency range.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.129</doi>
          <udk>535.016</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>nanoplasmonic</keyword>
            <keyword>logic gate</keyword>
            <keyword>Mach-Zehnder-type interferometer</keyword>
            <keyword>carbon nanotube</keyword>
            <keyword>plasmon interference</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.29/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>170-175</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Goldberg </surname>
              <initials>Artemiy </initials>
              <email>artemiy.goldberg@mail.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Provodin</surname>
              <initials>Daniil</initials>
              <email>provodindanya@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Kochetkov </surname>
              <initials>Igor </initials>
              <email>K.Igor.D@yandex.ru</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Davydov</surname>
              <initials>Vadim</initials>
              <email>davydov_vadim66@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Features of investigation of liquid media by optical differential method in express-control</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The features of liquid media investigation during express control using the phenomenon of refraction are considered. The advantages of using the differential method for investigation of liquid media in comparison with the others are noted. The features of liquid media investigation with using the differential method are established. A new technique for liquid media investigation has been developed, which allows changing the discreteness of the scale for measuring the refractive index n in the range from 1.2300 to 2.230. The design of the Anderson differential cuvette has been developed for carrying out research with required accuracy, by changing the discreteness of the measurement scale n. The results of experimental investigations of liquid media (water and water with iron oxides) are presented.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.130</doi>
          <udk>535-7</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>liquid</keyword>
            <keyword>refraction</keyword>
            <keyword>refractive index</keyword>
            <keyword>Anderson differential cell</keyword>
            <keyword>laser radiation</keyword>
            <keyword>axis</keyword>
            <keyword>medium state control</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.30/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>176-181</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Kadinskaya </surname>
              <initials>Svetlana </initials>
              <email>skadinskaya@bk.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-3469-5897</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Kondratev</surname>
              <initials>Valeriy</initials>
              <email>kvm_96@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0001-7143-6686</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Kusnetsov</surname>
              <initials>Alexey</initials>
              <email>alkuznetsov1998@gmail.com</email>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Lihachev </surname>
              <initials>Alexey</initials>
              <email>lihachev_alexey@bk.ru</email>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <surname>Nashchekin</surname>
              <initials>Alexey V.</initials>
              <email>nashchekin@mail.ioffe.ru</email>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>St.Petersburg State University of Film and Television</orgName>
              <surname>Akopyan</surname>
              <initials>Irina</initials>
              <email>irina-akopyan@yandex.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>St. Petersburg State University</orgName>
              <surname>Serov</surname>
              <initials>Alexey</initials>
              <email>a.serov@spbu.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <orgName>St.Petersburg  State University</orgName>
              <surname>Labzovskaya</surname>
              <initials>Mariana</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="009">
            <authorCodes>
              <orcid>0000-0002-3705-9706</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>St.Petersburg State University of Film and Television</orgName>
              <surname>Mikushev</surname>
              <initials>Sergey</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="010">
            <individInfo lang="ENG">
              <orgName>St.Petersburg  State University</orgName>
              <surname>Novikov</surname>
              <initials>Boris</initials>
              <email>bono1933@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="011">
            <individInfo lang="ENG">
              <orgName>St. Petersburg State University</orgName>
              <surname>Shtrom</surname>
              <initials>Igor</initials>
              <email>i.shtrom@spbu.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="012">
            <authorCodes>
              <orcid>0000-0001-7223-7232</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Bolshakov</surname>
              <initials>Alexey</initials>
              <email>acr1235@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Deep-Level Emission Tailoring in ZnO Nanostructures Grown via Hydrothermal Synthesis</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Development of the new approaches for synthesis of luminescent semiconductor nanomaterials is of high demand. In this work, nano- and microstructures of zinc oxide were synthesized by the hydrothermal method to provide new insight onto the optimization of this material optical properties. The possibility of controlling the synthesized ZnO geometry and morphology using various surfactants during the synthesis was demonstrated. Further study of the structures obtained by PL spectroscopy made it possible to observe a correlation between the hydrothermal growth conditions and the obtained ZnO nanostructures optical properties. This property, together with the ability to control the structures geometry, opens up new possibilities for their application in nanophotonics, UV-VIS and white light sources.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.131</doi>
          <udk>535.015</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>zinc oxide</keyword>
            <keyword>hydrothermal</keyword>
            <keyword>nanowire</keyword>
            <keyword>photoluminescence</keyword>
            <keyword>deep level emission</keyword>
            <keyword>PEI</keyword>
            <keyword>sodium citrate</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.31/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>182-186</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Nadoyan </surname>
              <initials>Irina </initials>
              <email>ir.nadoyan@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-3947-8648</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Solomonov</surname>
              <initials>Nikita</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0001-8440-494X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Novikova</surname>
              <initials>Kristina</initials>
              <email>novikova_k@spbau.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Sharov</surname>
              <initials>Vladislav</initials>
              <email>vl_sharov@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0000-0002-8661-4083</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Mozharov</surname>
              <initials>Alexey</initials>
              <email>mozharov@spbau.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Kislov</surname>
              <initials>Denis</initials>
              <email>denis.kislov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Petrov</surname>
              <initials>Mihail</initials>
              <email>m.petrov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <authorCodes>
              <orcid>0000-0001-9792-045X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Mukhin</surname>
              <initials>Ivan</initials>
              <email>muhin_is@spbstu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Nanooscillators based on carbon whiskers for detectors of optomechanical effects</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">A new mechanical resonance method for determining the effect of photoinduced heating from laser radiation on mechanical systems based on carbon whiskers was developed. We demonstrate a fast and universal approach for manufacturing the resonant nanooscillator detecting the effect of optical radiation on the properties of nanoobjects. The nanomechanical whisker-based resonator was grown on at the end of the tungsten needle using an electron beam induced deposition approach implemented in a scanning electron microscope. The influence of laser radiation on the mechanical properties of nanoresonators was experimentally revealed, and the trajectory of their movement at the first mechanical mode was visualized. The demonstrated approach for detecting the influence of optical radiation on the vibrational characteristics of nanooscillators paves the way for new photothermal and optomechanical sensors.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.132</doi>
          <udk>538.9</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>nanowhiskers oscillations</keyword>
            <keyword>optical heating</keyword>
            <keyword>optical power sensing</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.32/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>187-192</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0009-0003-5049-538X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Zavyalova </surname>
              <initials>Eseniya </initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-7143-6686</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Kusnetsov</surname>
              <initials>Alexey</initials>
              <email>alkuznetsov1998@gmail.com</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0009-0003-4890-683X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Rider</surname>
              <initials>Maxim</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0002-3469-5897</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Kondratev</surname>
              <initials>Valeriy</initials>
              <email>kvm_96@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0009-0003-7988-7520</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Kovova</surname>
              <initials>Mariia</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <authorCodes>
              <orcid>0000-0002-9658-5036</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Alferov University</orgName>
              <surname>Shmakov</surname>
              <initials>Stanislav</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <surname>Fedorov</surname>
              <initials>Valery</initials>
              <email>vfedorov@pnpi.spb.ru</email>
            </individInfo>
          </author>
          <author num="008">
            <authorCodes>
              <orcid>0000-0001-9626-8543</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Zakharov</surname>
              <initials>Viktor</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="009">
            <authorCodes>
              <orcid>0000-0001-7223-7232</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Bolshakov</surname>
              <initials>Alexey</initials>
              <email>acr1235@mail.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Towards versatile photonics based on GaP nanowires decorated with carbon dots</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Carbon dots (CDs) exhibit great potential as nanostructures in photonics due to their simple fabrication process, adaptable and effective emission. We used hydrothermal synthesis to fabricate CDs and decorated vertical gallium phosphide (GaP) nanowire array. Through feasible drop-casting deposition technique, we successfully observed efficient luminescence across the nanowires surface using confocal microscopy. Numerical calculations combined with experimental data revealed amplified luminescence through the resonant optical modes of the nanowire, acting as a waveguide. As a result, this study provides insight into the possibility of development of novel photonic devices by decorating optically dense nanowires with CDs to enhance and control over the emission efficiency and propagation.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.133</doi>
          <udk>537.876.4</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>carbon dots</keyword>
            <keyword>gallium phosphide</keyword>
            <keyword>nanowires</keyword>
            <keyword>confocal microscopy</keyword>
            <keyword>photoluminescence</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.33/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>193-197</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0002-6762-2053</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Southern Federal University</orgName>
              <surname>Dukhan </surname>
              <initials>Denis </initials>
              <email>duhan@sfedu.ru </email>
              <address>Taganrog, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Balakirev</surname>
              <initials>Sergey</initials>
              <email>sbalakirev@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-1799-1125</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Shanghai University</orgName>
              <surname>Voloshina</surname>
              <initials>Elena</initials>
              <address>Shanghai, China</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <surname>Solodovnik</surname>
              <initials>Maxim</initials>
              <email>solodovnikms@sfedu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Ab initio modelling of In wetting layer formation on As-stabilized GaAs during first stages of droplet epitaxy</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this work we carry out theoretical study of the formation of an In wetting layer on the surface of As-stabilized GaAs(001)-(1×1) to better understand the growth kinetics of metal droplets during droplet epitaxy. For this study, we calculate the dependence of the adatom adsorption energy (Eads) on the In coverage, since its value describes force with which adatoms interact with substrates, directly affecting their mobility. Calculations were performed using the state-of-the-art approaches of the density functional theory. The results show that at 0.125 ML coverage Eads has very high value of 8.48 eV which is explained by the adsorbate induced surface reconstruction being included in calculated value. With increasing coverage Eads dropped significantly (down to 3.588 eV/adatom at 1.75 ML coverage) which can lead to subsequent adatoms having greater mobility and can affect the size and surface density of metal nanodroplets and quantum dots based on them.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.134</doi>
          <udk>538.975</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>density functional theory</keyword>
            <keyword>GaAs</keyword>
            <keyword>indium</keyword>
            <keyword>adsorption energy</keyword>
            <keyword>critical thickness</keyword>
            <keyword>droplet epitaxy</keyword>
            <keyword>molecular beam epitaxy</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.34/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>198-203</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0002-3698-6700</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Wang</surname>
              <initials>Ding</initials>
              <email>jssdwang06@mail.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Davydov</surname>
              <initials>Vadim</initials>
              <email>davydov_vadim66@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Formation features of motion trajectory of mercury-199 ions in the quantum frequency standard for space applications </artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The necessity of developing an atomic clock that can operate without adjusting the scale during a satellite-to-Earth communication session is substantiated. This is necessary to place a satellite constellation in higher orbits, where a stable and long communication session with the Earth cannot always be realized. It is also necessary during a long flight in outer space (between planets). The problems that arise in the operation of the current models of atomic clocks now in use in orbit are mentioned. It has been established that the most promising solution to this problem is the use of atomic clocks on mercury-199 ions. The main problem that arises when reducing the size of the structure of atomic clocks on mercury-199 ions when they are placed on a satellite or on an autonomous space mobile object is considered in detail. To solve this problem, a mathematical model has been developed to calculate the trajectory of mercury-199 ions in the Paul trap when its dimensions change, which must be selected in accordance with the technical characteristics of the satellite or moving object. The modeling results of ion motion trajectory depending on the parameters of trap rods and control voltages are presented. Options for determining the optimal parameters of ion trap under conditions of limited volume and mass of the atomic clock are proposed.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.135</doi>
          <udk>53.09</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>Global navigation satellite systems</keyword>
            <keyword>quantum frequency standard on mercury-199 ions</keyword>
            <keyword>Paul trap</keyword>
            <keyword>Mathieu equation</keyword>
            <keyword>trajectory of ions</keyword>
            <keyword>optimal parameter</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.35/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>204-208</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Zhurina </surname>
              <initials>Angelina </initials>
              <email>gelya.zhurina@mail.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Pecherskaya</surname>
              <initials>Ekaterina</initials>
              <email>pea1@list.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0009-0000-9721-9401</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Penza State University</orgName>
              <surname>Emelyanov</surname>
              <initials>Nikita</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0001-5075-2727</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Penza State University</orgName>
              <surname>Shepeleva</surname>
              <initials>Juliya</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Penza State University</orgName>
              <surname>Kozlov</surname>
              <initials>Gennady</initials>
              <email>politeh@pnzgu.ru</email>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Determination of the electrophysical parameters of piezoelectrics using complex conductivity</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The use of piezomaterials as a substrate for a graphene structure is considered. Since the surface acoustic waves generated in piezoelectric materials, are on the surface of a solid body, piezoelectrics can act as a substrate for graphene. Methods for determining the electrical parameters of piezoelectric materials are studied and selected, the ways to improve these methods are considered. In order for piezoelectrics to be used as a substrate for graphene, the properties of piezoelectrics must be carefully studied. Therefore, the frequency characteristics of a sample in the form of a tablet based on solid solutions of zirconate – lead titanate were measured. As an improvement in the methods for determining the electrophysical parameters of piezoelectric elements, it is proposed to process the measurement results automatically using a multifunctional mathematical program, such data processing helps to reduce the error of indirect measurement results of the electrophysical parameters of piezoelectric materials. A graph of the amplitude-frequency characteristics of the sample was built. Thanks to computer processing, it was possible to reveal the relationship between the piezoelectric constant of the sample and its geometric dimensions. It turned out that the piezoelectric element dimensions strongly affect the frequency response and other piezoelectric constants.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.136</doi>
          <udk>666.665</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>graphene</keyword>
            <keyword>piezoelectrics</keyword>
            <keyword>electrophysical parameters of piezoelectrics</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.36/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>209-215</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Bauman Moscow State Technical University</orgName>
              <surname>Vetrova</surname>
              <initials>Natalia</initials>
              <email>vetrova@bmstu.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-6485-6754</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Bauman Moscow State Technical University</orgName>
              <surname>Kuimov </surname>
              <initials>Evgeny </initials>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Bauman Moscow State Technical University</orgName>
              <surname>Shashurin</surname>
              <initials>Vasily</initials>
              <email>shashurin@bmstu.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Bauman Moscow State Technical University</orgName>
              <surname>Luneva</surname>
              <initials>Lubov</initials>
              <email>luneva@bmstu.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Bauman Moscow State Technical University</orgName>
              <surname>Meshkov </surname>
              <initials>Sergey </initials>
              <email>meschkow@bmstu.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>Bauman Moscow State Technical University</orgName>
              <surname>Makeev</surname>
              <initials>Mstislav</initials>
              <email>m.makeev@bmstu.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>Saint Petersburg Mining University</orgName>
              <surname>Kozhukov</surname>
              <initials>Andrey</initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Modeling of current-voltage characteristics of resonant tunneling structures for solving the problems of studying objective functions in the problems of synthesizing resonant tunneling diode</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The resonant tunneling diode (RTD), due to the possibility of targeted synthesis of the current-voltage characteristic, is one of the most attractive non-linear elements of signal converters. To realize the advantages of the RTD, a model of its current-voltage characteristic (CVC) is needed, however, the existing models do not allow for a physical and mathematical interpretation of the relationships between the CVC parameters and the RTD design, which makes it impossible to analyze the objective functions and, as a result, the choice of optimization method. Hence, the problem of studying objective functions arises, which makes the choice of the optimization method unreasonable. To solve this problem, a compact analytical model of current transfer has been developed, the distinguishing features of which are the allowance for interelectronic interaction and the absence of undetermined empirical correction factors. Estimates of the electron density in the quantum well of the RTD heterostructural channel and the self-consistent correction to resonant levels are obtained. The developed model makes it possible to obtain estimates comparable in accuracy with estimates of distributed models over the entire area of the positive differential resistance of CVC with a relative error for AlGaAs structures not exceeding 1%, which meets the requirements of the design problems of modern radio electronic devices, in particular, devices for converting the frequency of radio signals for receiving - transmitting systems for various purposes. Thus, the presented compact model is promising for integration into RTD-based device design systems.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.137</doi>
          <udk>621.382</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>mathematical modeling</keyword>
            <keyword>resonant tunneling structures</keyword>
            <keyword>self-consistent potential</keyword>
            <keyword>electron density</keyword>
            <keyword>oscillators</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.37/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>216-220</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0002-8163-4245</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Ivchenko </surname>
              <initials>Egor </initials>
              <email>ivchenko.ei@phystech.edu</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0003-1511-1128</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Khmelev</surname>
              <initials>Aleksandr</initials>
              <email>a.khmelev@goqrate.com</email>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-1599-9801</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Kurochkin</surname>
              <initials>Vladimir</initials>
              <email>v.kurochkin@rqc.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Detection-efficiency mismatch in a satellite-to-ground quantum communication</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The detection efficiency mismatch is one of the issues with practical quantum key distribution. The challenge is also inherent in satellite quantum communication due to the detectors and optical elements imperfections in the different quantum channels. Here, we generalize the theory developed for optical fiber QKD to satellite-to-ground QKD with four unbalanced polarization channels to estimate the secret key length. We simulate satellite quantum communication for the measured parameters of the realistic receiving ground station and calculate bounds for the secret key rate and length using two approaches: the first one when you separate the data on bases and the second when calculate the key from the full amount of data. We discuss the advantages and disadvantages of each approach and describe ways to operate with them. For our ground station, the secret key rate turned out to be 20% less when the detection-efficiency mismatch was at 1:2 and we used the optimal way to calculate the key.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.138</doi>
          <udk>004.056.55</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>quantum key distribution</keyword>
            <keyword>satellite-to-ground channel</keyword>
            <keyword>modeling</keyword>
            <keyword>detection-efficiency mismatch</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.38/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>221-226</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0003-4206-4136</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Southern Federal University</orgName>
              <surname>Saenko </surname>
              <initials>Aleksandr </initials>
              <email>avsaenko@sfedu.ru</email>
              <address>Taganrog, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Southern Federal University</orgName>
              <surname>Bilyk</surname>
              <initials>German</initials>
              <email>bilyk@sfedu.ru</email>
              <address>Taganrog, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Southern Federal University</orgName>
              <surname>Malyukov</surname>
              <initials>Sergey</initials>
              <email>spmalyukov@sfedu.ru</email>
              <address>Taganrog, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Research of the photoelectric parameters of ZnO/Cu2O heterojunction solar cells</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Theoretical modeling of ZnO/Cu2O heterojunction solar cells has been carried out to optimize its structure and increase the energy conversion efficiency. The effect of the thickness and defect concentration in Cu2O and ZnO layers on the efficiency of a solar cell is studied. It was found that the optimal thickness of the Cu2O and ZnO layers should be 5 µm and 20 nm, respectively. It is shown that to obtain a high efficiency of a solar cell, the defect concentration (copper vacancies) in the Cu2O layer should be 1015 cm−3, and the defect concentration (oxygen vacancies) in the ZnO layer should be 1019 cm−3. The maximum efficiency of a solar cell based on ZnO/Cu2O is 6 %. The experimental formation of Cu2O and ZnO layers by magnetron sputtering at room temperature has been carried out, their surface morphology has been studied, and experimental samples of oxide solar cells have been created.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.139</doi>
          <udk>621.383</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>numerical simulation</keyword>
            <keyword>oxide semiconductors</keyword>
            <keyword>layer thickness</keyword>
            <keyword>defect concentration</keyword>
            <keyword>solar cell</keyword>
            <keyword>photovoltaic parameters</keyword>
            <keyword>magnetron sputtering</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.39/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>227-231</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Mozhayko </surname>
              <initials>Anna </initials>
              <email>annaanna-1996@mail.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Gerashchenkov </surname>
              <initials>Dmitry </initials>
              <email>gda.spb@gmail.com</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <surname>Davydov</surname>
              <initials>Vadim</initials>
              <email>davydov_vadim66@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Theoretical and experimental study of laser treatment of nickel using a diode laser</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In recent years, laser surface treatment (LST) has widely used to improve the properties of nickel coatings. LST has many advantages, however, different coating thicknesses require different modes, which can be selected using simulation. In this study, the modeling process is considered and an experiment is conducted to study the effect of LST process parameters on melt pool sizes. The aim of this research was therefore to reveal the dependence of the melt pool depth, namely the thickness of the layer in which the mixing process of components takes place, on the scan speed using a diode laser. With LST by diode laser, the thickness of the processed layer reaches about 500 μm, and the width of the processed surface is about 6 mm.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.140</doi>
          <udk>621.78+001.891.573</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>laser surface treatment</keyword>
            <keyword>thermal modeling</keyword>
            <keyword>finite element method</keyword>
            <keyword>nickel</keyword>
            <keyword>melt pool</keyword>
            <keyword>cold spraying</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.40/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>232-236</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Khomyakova </surname>
              <initials>Kristina</initials>
              <email>homiackowa.kristina@yandex.ru</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Deeb</surname>
              <initials>Hazem</initials>
              <email>deeb.hazem.syr@gmail.com</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-4029-8353</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Lozovoy</surname>
              <initials>Kirill</initials>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>National Research Tomsk State University</orgName>
              <surname>Kokhanenko  </surname>
              <initials>Andrey</initials>
              <email>kokh@mail.tsu.ru</email>
              <address>Tomsk, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Modeling the characteristics of avalanche photodiodes based on Ge/Si</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this article, the planar structure of an avalanche photodiode based on Ge/Si is designed. The dependences of the gain and bandwidth on the bias voltage for different thicknesses of the absorption and multiplication layers of an avalanche photodiode based on Ge/Si are presented.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.141</doi>
          <udk>621.383.523</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>optoelectronics</keyword>
            <keyword>avalanche photodiode</keyword>
            <keyword>impact ionization</keyword>
            <keyword>planar structure</keyword>
            <keyword>gain-bandwidth product</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.41/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>237-241</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0001-7319-8001</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Filyaev </surname>
              <initials>Alexandr </initials>
              <email>a.filiaev@misis.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0002-6030-2532</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Losev </surname>
              <initials>Anton </initials>
              <email>losev.av@misis.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-3252-2984</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Zavodilenko</surname>
              <initials>Vladimir</initials>
              <email>v.zavodilenko@misis.com</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0001-8865-556X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Pavlov</surname>
              <initials>Igor</initials>
              <email>pavlov.id@misis.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Evaluation of quantum efficiency of InGaAs/InP single-photon detectors in quantum key distribution systems</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this paper an important parameter of single-photon detectors, such as quantum efficiency, is considered. Errors in determining this parameter lead to significant errors in the parameters of a quantum key distribution system, where such detectors find their application. Three models are proposed to estimate photon detection efficiency or quantum efficiency and their main advantages and disadvantages are considered. A special experimental setup has been developed to carry out validation of the presented models on experimental data. It was found that at low values of laser radiation power the dependent and empirical models give good results, and the independent model is not applicable.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.142</doi>
          <udk>53.082.52; 621.3.084.2</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>quantum efficiency</keyword>
            <keyword>single-photon detector</keyword>
            <keyword>quantum key distribution systems</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.42/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>242-247</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0002-3252-2984</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Zavodilenko</surname>
              <initials>Vladimir</initials>
              <email>v.zavodilenko@misis.com</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-7319-8001</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Filyaev </surname>
              <initials>Alexandr </initials>
              <email>a.filiaev@misis.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-6030-2532</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Losev </surname>
              <initials>Anton </initials>
              <email>losev.av@misis.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0001-8865-556X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>National Research Technological University (MISiS)</orgName>
              <surname>Pavlov</surname>
              <initials>Igor</initials>
              <email>pavlov.id@misis.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Investigation on the effects of the multiplication area shape on the dark count rate in InGaAs/InAlAs single-photon avalanche photodiodes</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this paper the influence of the multiplication area shape on the dark count rate (DCR) of InGaAs/InAlAs single-photon avalanche photodiodes (SPADs) is discussed. This study is carried out within the framework of SPAD design parameter optimization. The diode structure has been simulated in the T-CAD calculation environment. The structure with three levels of multiplication area with a smooth transition is the most optimal one. This structure will achieve higher quantum efficiency during the diode operation.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.143</doi>
          <udk>53.082.52; 621.3.084.2</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>multiplication area</keyword>
            <keyword>dark count rate</keyword>
            <keyword>single-photon avalanche photodiodes</keyword>
            <keyword>single-photon detector</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.43/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>243-253</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>Mendeleev Russian University of Chemistry and Technology</orgName>
              <surname>Kalyakin </surname>
              <initials>Timofey </initials>
              <email>t.s.kalyakin@gmail.com</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>Mendeleev Russian University of Chemistry and Technology</orgName>
              <surname>Danilov</surname>
              <initials>Egor</initials>
              <email>danilovegor1@gmail.com</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Optical extinction and electrical conductivity measurements as express techniques to estimate concentrations of graphene suspensions</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">This article explores a method for determining the concentration of graphene dispersion using the integral optical technique based on the Beer-Lambert-Bouguer law for direct ultrasonic exfoliation method. The results showed nonlinear dependence of conductivity on concentration, indicating fundamental differences in the mechanism of exfoliation at different solid phase concentrations. Graphene dispersions in ethylene glycol also exhibited low transmittance in the visible region of the spectrum, which requires the use of other research methods for higher concentrations. Extinction coefficients were determined to calculate the concentration of graphene in the dispersion, which allows for the calculation of light absorption in the solution at a certain concentration and beam path length. The obtained results can be useful for further use of graphene in optoelectronic devices. Additionally, the concentration of few-layered graphene particles was calculated in the suspension obtained by liquid-phase exfoliation method with an initial graphite concentration of 6 mg/ml.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.144</doi>
          <udk>544.774.3; 544.77.03; 544.77.051.1; 661.666.2</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>graphene</keyword>
            <keyword>Beer-Lambert-Bouguer law</keyword>
            <keyword>concentration</keyword>
            <keyword>exfoliation</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.44/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>254-257</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Ivanishcheva</surname>
              <initials>Alexandra</initials>
              <email>starnikova@sfedu.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0003-3725-6053</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <surname>Petrov</surname>
              <initials>Viktor</initials>
              <email>vvpetrov@sfedu.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Research of temperature dependence of conductivity of arrays of ZnO/Au and ZnO/SnO2 nanorods under the influence of combined visible and ultraviolet irradiation</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Arrays of ZnO nanorods of vertical orientation were synthesized by hydrothermal method on quartz substrates. The nanorods had a length of 500‒800 nm and an average cross-sectional size of 40–80 nm. On top of ZnO nanorods, by vacuum thermal evaporation and subsequent annealing at 300 °C, gold (Au) nanoclusters with average sizes of 9 ± 1 nm and 4 ± 0.5 nm and tin oxide (SnO2) nanoclusters with average sizes of 30 ± 5 nm and 15 ± 3 nm. To fabricate resistive sensor elements, V-Ni contact metallization was formed over nanorods by vacuum thermal evaporation. The study of the electrophysical characteristics of arrays of ZnO/Au nanorods showed that the simultaneous effect of temperature and radiation from a LED with a wavelength of 400 nm leads to almost temperature independence of the conductivity of sensor elements.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.145</doi>
          <udk>504.064.3</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>ZnO</keyword>
            <keyword>nanorods</keyword>
            <keyword>electrophysical properties</keyword>
            <keyword>ultraviolet irradiation</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.45/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>258-263</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0003-4164-178X</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Kornyushin </surname>
              <initials>Denis </initials>
              <email>kornyushin.d@phystech.edu</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-9780-9137</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Musaev</surname>
              <initials>Andrey</initials>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Vershinina</surname>
              <initials>Olesya</initials>
              <email>seraia.ov@phystech.edu</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Ivanov</surname>
              <initials>Mattew</initials>
              <email>ms.ivanov@phystech.edu</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Kameneva</surname>
              <initials>Ekaterina</initials>
              <email>kameneva.ei@phystech.edu</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Volkov</surname>
              <initials>Ivan</initials>
              <email>volkov.ia@mipt.ru</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <orgName>Moscow Institute of Physics and Technology (National Research University)</orgName>
              <surname>Efimov</surname>
              <initials>Alexey</initials>
              <email>efimov.aa@mipt.ru</email>
              <address>Dolgoprudny, Moscow region, Russian Federation</address>
            </individInfo>
          </author>
          <author num="008">
            <individInfo lang="ENG">
              <surname>Ivanov</surname>
              <initials>Victor</initials>
              <email>ivanov.vv@mipt.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Effect of the thickness of plasmonic gold nanostructures on the surface enhanced Raman scattering</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">In this work, we studied the influence of the thickness of plasmonic nanostructures composed of gold nanoparticles on the intensity of lines in SERS spectra of methylene blue (MB), 1,2 bis(4 pyridyl)ethylene (BPE), and malachite green (MG) used as analytes. Plasmonic nanostructures were patterned on alumina substrates by dry aerosol printing with spark discharge synthesized gold nanoparticles (mean size 9.5 nm) and represented layers 3 mm × 3 mm in size with the thickness of about 0.3, 0.4, and 0.5 μm. The enhancement factor was estimated at 5.5×106 for MB, 8.0×106 for BPE, and 2.1×107 for MG by using SERS spectra measured on nanostructures with the optimal thickness of 0.4 μm.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.146</doi>
          <udk>539.231, 538.97</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>nanoparticles</keyword>
            <keyword>gold</keyword>
            <keyword>spark gas-discharge</keyword>
            <keyword>focused deposition</keyword>
            <keyword>plasmonic nanostructures (PN)</keyword>
            <keyword>SERS</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.46/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>264-268</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <surname>Shepeleva</surname>
              <initials>Anastasia</initials>
              <email>eduard.shepelev.67@mail.ru</email>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-9602-7221</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Gurin</surname>
              <initials>Sergey</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0001-9319-2475</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Novichkov </surname>
              <initials>Maksim </initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0009-0005-5656-4918</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Zuev</surname>
              <initials>Vyacheslav</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <authorCodes>
              <orcid>0009-0006-3140-5897</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Ryzhov</surname>
              <initials>Alexandr</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <authorCodes>
              <orcid>0009-0003-1945-5646</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Deryabin</surname>
              <initials>Denis</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Gas sensors based on zinc oxide nanorods with colloid quantum dots</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">A design and technological solution for increasing the temporal stability of gas sensors based on the nanorods-colloidal quantum dots structure is presented. For this purpose, zinc oxide nanorods oriented predominantly to the surface normal were grown by the hydrothermal method. Silicon nitride, followed by etching to the level of zinc oxide colloidal dots in an inductively coupled plasma using a gas mixture based on sulfur hexafluoride, was deposited onto the resulting structure by RF magnetron sputtering. Through accelerated aging testing, it has been found that silicon carbide protected zinc oxide nanorods exhibit greater temporal stability due to less surface oxidation resulting in a reduction in specific surface area. Silver nanoparticles with a plasmon effect were deposited onto the resulting structure by centrifugation.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.147</doi>
          <udk>621.317.39.084.2</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>gas-sensitive material</keyword>
            <keyword>nanorods</keyword>
            <keyword>optical radiation</keyword>
            <keyword>silver nanoparticles</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.47/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>269-272</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0001-9319-2475</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Novichkov </surname>
              <initials>Maksim </initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <authorCodes>
              <orcid>0000-0001-9602-7221</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Gurin</surname>
              <initials>Sergey</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <authorCodes>
              <orcid>0000-0002-7053-4775</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Research Institute of Electronic and Mechanical Devices</orgName>
              <surname>Nesterov</surname>
              <initials>Sergey</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0002-2088-5497</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Penza State University</orgName>
              <surname>Shelakhaev</surname>
              <initials>Dmitry</initials>
              <address>Penza, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <surname>Pecherskaya</surname>
              <initials>Ekaterina</initials>
              <email>pea1@list.ru</email>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Shepeleva</surname>
              <initials>Anastasia</initials>
              <email>eduard.shepelev.67@mail.ru</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Study of deposition of heterogeneous structures on ion-exchange membranes</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The process of a heterogeneous catalytic coating formation on the ion-exchange membranes surface was studied in this work. It is determined that the use of the chemical deposition method results in a highly porous coating, but with low strength and durability. A combined method for obtaining a heterogeneous catalytic coating is proposed, which includes the formation of adsorption centers by thermal vacuum spraying and the growth of the bulk of the catalyst by chemical deposition.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.148</doi>
          <udk>544.478-03</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>heterogeneous structure</keyword>
            <keyword>ion-exchange membrane</keyword>
            <keyword>electrolysis</keyword>
            <keyword>hydrogen production</keyword>
            <keyword>catalyst</keyword>
            <keyword>deposition</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.48/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>273-277</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Abramov </surname>
              <initials>Artem </initials>
              <email>artem.abramov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Chestnov</surname>
              <initials>Igor</initials>
              <email>igor.chestnov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Iorsh</surname>
              <initials>Ivan</initials>
              <email>i.iorsh@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>ITMO University</orgName>
              <surname>Kravtsov</surname>
              <initials>Vasily</initials>
              <email>vasily.kravtsov@metalab.ifmo.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Localization microscopy of single photon emitters in locally strained monolayer semiconductor</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Integration of single photon emitters with nanophotonic structures on a chip is key for the development of future quantum optoelectronic devices. Here we study the formation of single photon emitters in a WSe2 monolayer by local nanoindentation with an atomic force microscope probe. Using the bichromatic photoluminescence-imaging approach, we define the spatial locations of single photon emitters with deep sub-wavelength accuracy.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.149</doi>
          <udk>538.911</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>single photon emitter</keyword>
            <keyword>two-dimensional materials</keyword>
            <keyword>nanophotonics</keyword>
            <keyword>quantum optics</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.49/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>278-283</pages>
        <authors>
          <author num="001">
            <authorCodes>
              <orcid>0000-0003-3589-8941</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Peter the Great St. Petersburg Polytechnic University</orgName>
              <surname>Boudjemila </surname>
              <initials>Linda </initials>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <surname>Davydov</surname>
              <initials>Vadim</initials>
              <email>davydov_vadim66@mail.ru</email>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>Ioffe Institute</orgName>
              <surname>Nenashev</surname>
              <initials>Grigorii</initials>
              <email>virison95@gmail.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <authorCodes>
              <orcid>0000-0001-5449-4446</orcid>
            </authorCodes>
            <individInfo lang="ENG">
              <orgName>Ioffe Institute</orgName>
              <surname>Aleshin</surname>
              <initials>Andrey</initials>
              <email>aleshin@transport.ioffe.ru</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>Ioffe Institute</orgName>
              <surname>Malyshkin</surname>
              <initials>Vladislav</initials>
              <email>mal@gromco.com</email>
              <address>St. Petersburg, Russian Federation</address>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Exciton dynamics characterization by electrochemical impedance spectroscopy of CsPbBr3(I3) perovskite nanocrystals for photovoltaic application</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">The deposition of an additional layer of nanoparticles is a widely used method for improving the optical and electrical characteristics of semiconductor solar cells (SCs). We present the results of studies of impedance spectroscopy (IS) in operating sandwich structures based on films of nanocrystals (NC) of inorganic perovskites of lead halides CsPbI3 and CsPbBr3. These last are characterized by the presence of extensive phonon disorder in the former. This phonon disorder gives rise to unique electron–phonon coupling and dielectric responses. The perovskite material is deposited on the surface of a solar cell based on crystalline silicon (c-Si). The IS results show that under identical conditions, the Nyquist plots for both structures are in good agreement with the equivalent circuit model represented in continued line as a fit curve. It represents series resistance, recombination resistance and geometric capacitance, respectively, which arise due to charge accumulation, charge transfer resistance and/or additional interfacial electronic states. It is found, that adding of the CsPbI3 layer enhances the photo response under bias, but such a photo response leads to a decrease in dc conductivity. On the contrary, adding of the CsPbBr3 layer blocks the photo response under bias but slightly improves the photo response for the zero bias. The obtained results provide the way to improve the performance of next generation of tandem c-Si SCs with perovskite NCs upper layers.</abstract>
        </abstracts>
        <codes>
          <doi>10.18721/JPM.163.150</doi>
          <udk>539.1</udk>
        </codes>
        <keywords>
          <kwdGroup lang="ENG">
            <keyword>impedance spectroscopy</keyword>
            <keyword>perovskites</keyword>
            <keyword>nanocrystals</keyword>
            <keyword>crystalline silicon</keyword>
          </kwdGroup>
        </keywords>
        <files>
          <furl>https://physmath.spbstu.ru/article/2023.68.50/</furl>
          <file></file>
        </files>
      </article>
      <article>
        <artType>CNF</artType>
        <langPubl>RUS</langPubl>
        <pages>284-288</pages>
        <authors>
          <author num="001">
            <individInfo lang="ENG">
              <orgName>LLC “QRate”</orgName>
              <surname>Sodnomay</surname>
              <initials>Amgalan</initials>
              <email>a.sodnomay@goqrate.com</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="002">
            <individInfo lang="ENG">
              <orgName>LLC “QRate”</orgName>
              <surname>Mayboroda</surname>
              <initials>Vladimir</initials>
              <email>v.mayboroda@goqrate.com</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="003">
            <individInfo lang="ENG">
              <orgName>National Research University “Higher School of Economics”</orgName>
              <surname>Kovalyuk</surname>
              <initials>Vadim</initials>
              <email>lpkgarage@yandex.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="004">
            <individInfo lang="ENG">
              <orgName>Moscow Pedagogical State University</orgName>
              <surname>Golikov</surname>
              <initials>Alexander</initials>
              <email>gad_92@inbox.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="005">
            <individInfo lang="ENG">
              <orgName>National Research University “Higher School of Economics”</orgName>
              <surname>Chulkova</surname>
              <initials>Galina</initials>
              <email>gchulkova@hse.ru</email>
              <address>Moscow, Russian Federation</address>
            </individInfo>
          </author>
          <author num="006">
            <individInfo lang="ENG">
              <surname>Goltsman</surname>
              <initials>Grigory </initials>
              <email>goltsman@rplab.ru</email>
            </individInfo>
          </author>
          <author num="007">
            <individInfo lang="ENG">
              <surname>Shakhovoy</surname>
              <initials>Roman</initials>
              <email>r.shakhovoy@goqrate.com</email>
            </individInfo>
          </author>
        </authors>
        <artTitles>
          <artTitle lang="ENG">Passive optical scheme for BB84 protocol with polarization encoding on a silicon nitride platform</artTitle>
        </artTitles>
        <abstracts>
          <abstract lang="ENG">Quantum key distribution is a technology that promises unconditional security for protecting data. However, despite being based on the laws of quantum physics, its practical implementation may have critical vulnerabilities. One way to address this is to passively prepare quantum states. In our work, we demonstrate a passive optical scheme for the BB84 protocol with polarization encoding. We use a finite-difference time-domain method to simulate the elements of this scheme on the silicon nitride platform. Our simulations suggest that the polarization extinction ratio will be more than 20 