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<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "https://jats.nlm.nih.gov/publishing/1.3/JATS-journalpublishing1-3.dtd">
<article article-type="meeting-report" dtd-version="1.3" xml:lang="en">
  <front xmlns:xlink="http://www.w3.org/1999/xlink">
    <journal-meta>
      <journal-title-group>
        <journal-title>St. Petersburg Polytechnic University Journal: Physics and Mathematics</journal-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Научно-технические ведомости СПбГПУ. Физико-математические науки</trans-title>
        </trans-title-group>
      </journal-title-group>
      <issn pub-type="epub">2304-9782, 2618-8686, 2405-7223</issn>
    </journal-meta>
    <article-meta xmlns:xlink="http://www.w3.org/1999/xlink">
      <article-id pub-id-type="publisher-id">29</article-id>
      <article-id pub-id-type="doi">10.18721/JPM.183.229</article-id>
      <title-group>
        <article-title>Radiation hardness of n–p–n type bipolar transistor for voltage regulators</article-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Радиационная стойкость биполярного транзистора n–p–n типа для стабилизаторов напряжения</trans-title>
        </trans-title-group>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <contrib-id contrib-id-type="orcid">0000-0002-7746-3009</contrib-id>
          <name>
            <surname>Rybalka</surname>
            <given-names>Sergey</given-names>
          </name>
          <email>sbrybalka@yandex.ru</email>
        </contrib>
        <contrib contrib-type="author">
          <contrib-id contrib-id-type="orcid">0009-0009-7772-3411</contrib-id>
          <name>
            <surname>Sitnikov</surname>
            <given-names>Yury</given-names>
          </name>
        </contrib>
        <contrib contrib-type="author">
          <contrib-id contrib-id-type="orcid">0000-0002-7294-7549</contrib-id>
          <name>
            <surname>Kulchenkov</surname>
            <given-names>Evgeny</given-names>
          </name>
        </contrib>
        <contrib contrib-type="author">
          <contrib-id contrib-id-type="orcid">0000-0002-8639-3575</contrib-id>
          <name>
            <surname>Demidov</surname>
            <given-names>Andrey</given-names>
          </name>
        </contrib>
      </contrib-group>
      <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2025-12-19">
        <day>19</day>
        <month>12</month>
        <year>2025</year>
      </pub-date>
      <volume>18</volume>
      <issue>3.2</issue>
      <fpage>149</fpage>
      <lpage>154</lpage>
      <self-uri xmlns:xlink="http://www.w3.org/1999/xlink" content-type="pdf" xlink:href="https://physmath.spbstu.ru/userfiles/files/articles/2025/3.2/29_149-154_18(3_2)2025.pdf"/>
      <abstract xml:lang="en">
        <p>The characteristics (collector current, base current, common-emitter current gain) of n–p–n type bipolar transistor for voltage regulator depending on total ionizing dose radiation using projected X-ray research complex were established. The functional dependencies and model of common-emitter current gain depending on total ionizing dose have been obtained.</p>
      </abstract>
      <kwd-group xml:lang="en">
        <kwd>n–p–n type bipolar transistor</kwd>
        <kwd>ionizing dose effects</kwd>
        <kwd>X-ray irradiation</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
