St. Petersburg Polytechnic University Journal: Physics and Mathematics Научно-технические ведомости СПбГПУ. Физико-математические науки 2304-9782, 2618-8686, 2405-7223 18 Using atomic-force microscopy techniques for an analysis of ferroelectric and magnetic properties of bismuth-doped terbium manganite at low temperatures Применение методов атомно-силовой микроскопии для анализа сегнетоэлектрических и магнитных свойств манганита тербия, легированного висмутом, при низких температурах Andreeva Nataliya Sanina Victoria 0000-0002-2793-5717 Filimonov Alexey filimonov@rphf.spbstu.ru 57197390995 AAD-9657-2019 Fotiadi Alexander fotiadi@rphf.spbstu.ru Peter the Great St. Petersburg Polytechnic University 10 06 2013 2 170 137 143

Magnetic and ferroelectric properties of the doped single crystal Tb0.95Bi0.05MnO3 have been investigated using magnetic force microscopy and piezoresponse force microscopy in the temperature range of 4 – 30 K. Local magnetic and ferroelectric ordering in the Tb0.95Bi0.05MnO3 crystal was observed at low temperatures. An absence of correlation in distribution of ferromagnetic clusters and polar nanodomain areas was found in the temperature range of 4 – 30 K.

 multiferroics manganite of terbium bismuth low temperature piezoresponse force microscopy low temperature magnetic force microscopy