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<article article-type="research-article" dtd-version="1.3" xml:lang="en">
  <front>
    <journal-meta>
      <journal-title-group>
        <journal-title>St. Petersburg Polytechnic University Journal: Physics and Mathematics</journal-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Научно-технические ведомости СПбГПУ. Физико-математические науки</trans-title>
        </trans-title-group>
      </journal-title-group>
      <issn pub-type="epub">2304-9782, 2618-8686, 2405-7223</issn>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="publisher-id">2</article-id>
      <title-group>
        <article-title>The Frenkel pairs formation in the silicon under high energy electron and proton irradiation</article-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Образование пар Френкеля в кремнии под действием электронов и протонов высоких энергий</trans-title>
        </trans-title-group>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Kozlovski</surname>
            <given-names>Vitaly</given-names>
          </name>
          <xref ref-type="aff" rid="aff1"/>
          <email>vkozlovski@phmf.spbstu.ru </email>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Vasil'ev</surname>
            <given-names>Alexander</given-names>
          </name>
          <xref ref-type="aff" rid="aff1"/>
          <email>vasiliev_ae@spbstu.ru </email>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Emtsev</surname>
            <given-names>Vadim</given-names>
          </name>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Oganesjan</surname>
            <given-names>Gagik.A.</given-names>
          </name>
          <xref ref-type="aff" rid="aff2"/>
          <email>Gagik.Oganesyan@mail.ioffe.ru</email>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Kolgatin</surname>
            <given-names>Sergey</given-names>
          </name>
          <xref ref-type="aff" rid="aff3"/>
          <email>kolgatins@gmail.com</email>
        </contrib>
      </contrib-group>
      <aff id="aff1">Peter the Great St. Petersburg Polytechnic University</aff>
      <aff id="aff2">Ioffe Institute of RAS</aff>
      <aff id="aff3">Bonch-Bruevich St. Petersburg State University of Telecommunications</aff>
      <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2011-06-10">
        <day>10</day>
        <month>06</month>
        <year>2011</year>
      </pub-date>
      <issue>2</issue>
      <issue-id pub-id-type="publisher-id">122</issue-id>
      <fpage>13</fpage>
      <lpage>21</lpage>
      <abstract xml:lang="en">
        <p>The analysis of defect formation in silicon is made under the irradiations used for modeling of radiating belts of the Earth. It is shown the occurrence of microareas of silicon single-crystals with high concentration of vacancies in which reactions with formation of divacancy and their complexes with impurity atoms intensively proceed; there is a basic distinction in influence of a proton irradiation.</p>
      </abstract>
      <kwd-group xml:lang="en">
        <kwd>radiation defect</kwd>
        <kwd>silicon</kwd>
        <kwd>proton irradiation</kwd>
        <kwd>divacancy</kwd>
        <kwd>Frenkel pair</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
