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<article article-type="research-article" dtd-version="1.3" xml:lang="ru">
  <front>
    <journal-meta>
      <journal-title-group>
        <journal-title>St. Petersburg Polytechnic University Journal: Physics and Mathematics</journal-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Научно-технические ведомости СПбГПУ. Физико-математические науки</trans-title>
        </trans-title-group>
      </journal-title-group>
      <issn pub-type="epub">2304-9782, 2618-8686, 2405-7223</issn>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="publisher-id">10</article-id>
      <title-group>
        <article-title>Simulation of sputtering of the silicon carbide surface under bombardment by ions and clusters</article-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Моделирование распыления поверхности карбида кремния при бомбардировке ионами и кластерами</trans-title>
        </trans-title-group>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Grigoriev</surname>
            <given-names>Petr</given-names>
          </name>
          <email>grigorievpit@gmail.com</email>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Zhurkin</surname>
            <given-names>Evgeniy</given-names>
          </name>
          <email>ezhurkin@phmf.spbstu.ru</email>
        </contrib>
      </contrib-group>
      <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2011-06-10">
        <day>10</day>
        <month>06</month>
        <year>2011</year>
      </pub-date>
      <issue>2</issue>
      <issue-id pub-id-type="publisher-id">122</issue-id>
      <fpage>67</fpage>
      <lpage>74</lpage>
      <abstract xml:lang="en">
        <p>Characteristics of sputtering of the cubic silicon carbide (111) surface under low-energy bombardment by Si[N] and C[N]ions and clusters (TV =1 — 60) have been presented. An analysis of the correlations between non-additive increase of the sputtering yields and the features of the collision cascade in the target versus the incident cluster size and energy was carried out.</p>
      </abstract>
      <kwd-group xml:lang="en">
        <kwd>implantation</kwd>
        <kwd>clusters</kwd>
        <kwd>sputtering</kwd>
        <kwd>silicon carbide</kwd>
        <kwd>modelling</kwd>
        <kwd>simulation</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
